1) Is there any single event effects data available.
2) Does the part latch electrically?
3) Is the part CMOS or Bipolar?
thanks
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1) Is there any single event effects data available.
2) Does the part latch electrically?
3) Is the part CMOS or Bipolar?
thanks
Hi,
I will get back to you with requested info soon.
Regards,
AK
Hi Munir,
The qualification information is available on the device product page:
This device has not undergone any SEL radiation testing.
https://www.ti.com/product/DAC8830#order-quality
https://www.ti.com/qualificationsummary/qualsumm/home?actionId=2800&partNumber=DAC8830IBD
Here we show that the device passed latch-up testing per JESD78 spec.
The device is on a CMOS process but still may contain Bipolar transistors.