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DAC121S101QML-SP: DAC121S101QML SEU Report

David Thorndike
Prodigy 20 points
Part Number: DAC121S101QML-SP

I need an SEU report for the DAC121S101WGRQV.

I have found the available reports for through ti.com/radiation, which provided for TID, SET, SEFI, and the general SEE. However, those reports did not clarify the upset rate of the DAC Register.

I am interested in the upset rate of this DAC Register when operated in the static sampling mode, where the serial interface is written to once with no refresh of the input code in the DAC register during the testing.

 

  • 0
    TI__Genius 17035 points

    Hi David,

    The registers on the part are radiation hardened and do not get upset from ion strikes. "SEFI" is for single event functional interrupt which would be the result of a register upset. As shown in the SEE report, there were no SEFIs detected and the registers did not get upset. The only single event effect detected was an output transient, but after the transient subsided, the output voltage returned to its programmed value.

    See page 12 of the SEE report.

    https://www.ti.com/seclit/rr/snaa155/snaa155.pdf

  • 0 in reply to Kirby Kruckmeyer96848
    Prodigy 20 points

    Hi Kirby,

    There is a reasonably significant difference between SEUs and SEFIs.

    • An SEU is generally recognized as a change of state in a memory/storage element as a "soft" bit errors, where the device continues to function and rewriting the bit would return it to normal behavior.
    • An SEFI is a condition where the device stops normal functions, and usually requires a power reset to resume normal operations. It is a special case of SEU changing an internal control signal.

    To report that this DAC did not have any SEFIs (or stopped functioning) during testing is not the same thing as stating that the device's stored value in the DAC register did not experience a soft error. However, after reviewing the SEE report I can see the term SEFI was being used inclusive of soft SEUs.

    • "For the SEFI test, the part was tested in a static mode where the code was inputted once and never updated.
    • "To ensure that a possible SEFI might not have been detected due to the input and control code being updated every 1 μs, one unit was also tested in a static mode, where the input and control codes were inputted once and never updated."
    • "No evidence of a SEFI was seen while the part was tested in static mode. The output always returned to the expected voltage..."

    Thanks for the help.

    David