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AFE4300: I have a problem with continuous IQ measurements.

Part Number: AFE4300

Hello. I am using AFE4300 chip for impedance measurement.

Currently, the process of measurement is carried out in IQ mode to FWR mode.

In IQ mode, the process proceeds in the order of 8k-16k-32k-64kHz.


Measurements are made in the order of I, Q of the measured target and I, Q of the reference resistor 1, and I , Q of reference resistor 2.

result = 8kHz(target_I, target_Q, refer1_I, refer1_Q, refer2_I, refer2_Q), 16kHz(Same), 32kHz(Same), 64kHz(Same), FWR(target, ref1, ref2) ... repeat .

I get a total of 27 measurement values and repeat the sequence of measurements.

But there is a problem here.

At 8 kHz, the I value was acquired as a positive value and the Q value as a negative value.



However, at 16 kHz, 32 kHz and 64 kHz, the Q value varies greatly.



In FWR, both the measure value, reference1, and reference2 value are positive.

I think there is a problem when frequency changes in IQ mode.



How can we solve it?