Part Number: LP-XDS110
Other Parts Discussed in Thread: TMDSHSECDOCK
Hi,
We have anew LP-XDS110 and want to debug F28379D controlcard on TMDSHSECDOCK docking station. We did not have any problem with XDS100v2.
On the controlcard;
A.SW1 >> pin1 and pin2 off
SW1 >> Wait Mode
We use J2 JTAG connector , connect TMS, TDI, TDOi TCK and TRST to LP-XDS110 (TRST to nRST)
We use 5VDC of LP-XDS110 as external 5VDC for controlcard.
When we try to debug we get the following error.
-----[An error has occurred and this utility has aborted]--------------------
This error is generated by TI's USCIF driver or utilities.
The value is '-233' (0xffffff17).
The title is 'SC_ERR_PATH_BROKEN'.
The explanation is:
The JTAG IR and DR scan-paths cannot circulate bits, they may be broken.
An attempt to scan the JTAG scan-path has failed.
The target's JTAG scan-path appears to be broken
with a stuck-at-ones or stuck-at-zero fault.
[End: Texas Instruments XDS110 USB Debug Probe_0]
Something is wrong or missing.
Regards,
Vedat
