Other Parts Discussed in Thread: TMDSHVMTRINSPIN, TEST
While testing on TMDSHVMTRINSPIN development kit using TMDSCNCD28069MISO the Isolated JTAG was damaged.
Before connecting to the Mains, the development kit was connected to a VARIAC and a circuit breaker. The VARIAC was set to 0 VAC before closing the breaker. As soon as the Breaker was closed, the JTAG got damaged.
It appears that the Development kit has not been damaged as the power supply is still working and the Rectifier and IPM are still intact.
My question is how did an isolated Control Card with an isolated JTAG get damaged considering that the USB cable was connected to the Isolated JTAG?
Besides this what other test should I perform on the Development kit to check its integrity before using it again?