Background:we use SN6505A-Q1 for IGBT gate power driver, but when IGBT switching on/off , it produce high di/dt and dv/dt due to different hardware design, and in this case the peak voltage of the chip will lead to continuous misoperation of the internal ESD dynamic protection circuit, thus overheating failure
My question is if this SN6505A-Q1 have white box test (including voltage stress, current stress, thermal stress test....) and how can i get these report?
