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AM2632: PBIST / SOC documentation of testable memories

Part Number: AM2632

Hello, 

we want to use PBIST to test memory areas of R5F0-controller.

I tried the example from SDK and studied technical reference manual and register addendum manual for PBIST.
I am quiet unhappy, because I got not detailed information what memories are tested with the PBIST library.


Is there any document, which can describe the memory groups and algorithms, used for the PBIST test in the SDL-library.

I have found the file sdl_pbist_soc.c in the SDL-library.

In this file, there a configuration for the PBIST-test, which uses two fields of a structure of type SDL_PBIST_config, defined in sdl_ip_pbist.h.

Where can I find the mentioned SOC documentation of this variables?

Is there a list of possible variable values with correspondi´ng memeory areas?
What are the other variables for, and what possible values are there?


Best regards

Jo Scho

  • Hello Jo Scho,

    Unfortunately the information you are looking for is not present in the SOC documentation. 

    The file sdl_pbist_soc.c at SdkInstalledPath\source\sdl\pbist\v0\soc\am263x has the details on which memories are getting tested and the corresponding algorithms used.
    Please note below:
    .algorithmsBitMap = 0 => ROM - Triple_Read_XOR_Read algorithm
    .algorithmsBitMap = 4 => RAM - March 13N Single Port algorithm
    .algorithmsBitMap = 5 => RAM - March 13N Two Port algorithm

    .memoryGroupsBitMap already has the details on which memory is being tested.

    Only the values mentioned in the file sdl_pbist_soc.c are validated.

    Thanks and Regards,
    Vishwanath Reddy.