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Original question:

TMS320LF2407A: Difficulties in programming F2407A

TMS320LF2407A: 20 years later, what is the reliability and data retention of FLASH on the TMS320LF2407A?

Bob C
Intellectual 615 points

Part Number: TMS320LF2407A

Hello,

We're working to debug some strange issue on a returned embedded system that uses a TMS320LF2407A device.  This device was programmed approximately 20 years ago. 

Should we be considering the possibility that bits in the FLASH may have flipped over time (retention issue)? 

What is the probability of a single bit flip after being programmed so long ago? 

Also, I did review your Reliability Data application note (SPRA963B) on the FIT rate, but it's not clear whether this includes FLASH reliability.   Please clarify. 

www.ti.com/.../spra963b.pdf

Thank you

  • 0
    TI__Guru* 95315 points

    Bob,

         SPRA963 does not address flash reliability/endurance. I have reached out to the flash experts. Please give me a few days time to get an answer. This is an old device with very limited support.

    1. On a different note, do you have the means to connect to the device? i.e. do you have a working copy of CCSv3.3 and XDS510USB JTAG debug probe? 
    2. Do you have the COFF (.out) file that was originally programmed into the device?
  • 0 in reply to Hareesh Janakiraman
    TI__Guru* 95315 points

    Bob,

        Here is what our flash expert had to say:

    "Retention will always be dependent upon use conditions.  So we would need some insight into the conditions to which the device was subjected since programming the array. However, assuming nominal conditions (say <85'C), the probability of bit flip is low.  There is always possibility of a defect, but intrinsic reliability should be excellent.

    Since you say 20 years since programming, I’m also assuming there is no cycling of array involved here. i.e. no re-programming. 

    So in summary, the probability of  bit flip is low, but I can’t completely rule out a defect driving a low field leakage phenomenon."