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TMDSCNCD28379D: Connection using TMDSCNCD28379D (F2837x controlCARD Rev 1.3) to custom board

Vishal D
Prodigy 70 points
Part Number: TMDSCNCD28379D

Hello TI Team,

I have created a board using TMS320F28386SPTPQR micro-controller. I wanted to know if I can use debugger from the TI TMDSCNCD28379D (F2837x controlCARD Rev 1.3) to connect with TMS320F28386SPTPQR micro-controller or is the debugger has some specific settings to be used with on board micro controller ?

I tried to tap TI TMDSCNCD28379D (F2837x controlCARD Rev 1.3) card debugger to connect with my board but gives the error as

"IcePick_C_0: Error connecting to the target: (Error -2131 @ 0x0) Unable to access device register. Reset the device, and retry the operation. If error persists, confirm configuration, power-cycle the board, and/or try more reliable JTAG settings (e.g. lower TCLK). (Emulation package 9.8.0.00235) ".

 

So just trying to see if the issue is with my board or TI TMDSCNCD28379D (F2837x controlCARD Rev 1.3) card debugger can not be used for other boards.

Thanks!

  • 0
    TI__Genius 17070 points

    Hi,

    There should not be anything with the control card debug probe that would stop it from being used with a different C2000 device. It does seem like it would be difficult to TAP the signal from the controlCARD. You would need to get the TMS, TCK, TDI, TDO, and TRST signals from the controlCARD debug probe. Also, how is your target configuration set up? Could you please post your output log from testing connection? It should give the same message as your error.

    Best Regards,

    Ben Collier

  • 0 in reply to Benjamin Collier
    Prodigy 70 points

    Hello Ben,

    Thank you for the response.

    Please refer the attached test connection logs and target configuration for TMS320F28386SPTPQR controller.

    I am able to tap the TMS, TCK, TDI, TDO, and TRST signals from controlCard U6(2, and 3), U7(2 and 3) and U8(7) IC pins and on Board emulator ground. As this pins are directly interfaced with on board debugger ground so not sure if that can create any issue during connection.

    DebuugerTestLogs.txt 
    [Start: Texas Instruments XDS100v2 USB Debug Probe_0]

Execute the command:

%ccs_base%/common/uscif/dbgjtag -f %boarddatafile% -rv -o -F inform,logfile=yes -S pathlength -S integrity

[Result]


-----[Print the board config pathname(s)]------------------------------------

C:\Users\VISHAL~1\AppData\Local\TEXASI~1\
    CCS\ccs1200\0\0\BrdDat\testBoard.dat

-----[Print the reset-command software log-file]-----------------------------

This utility has selected a 100/110/510 class product.
This utility will load the adapter 'jioserdesusb.dll'.
The library build date was 'Jun 17 2022'.
The library build time was '22:30:41'.
The library package version is '9.8.0.00235'.
The library component version is '35.35.0.0'.
The controller does not use a programmable FPGA.
The controller has a version number of '4' (0x00000004).
The controller has an insertion length of '0' (0x00000000).
This utility will attempt to reset the controller.
This utility has successfully reset the controller.

-----[Print the reset-command hardware log-file]-----------------------------

The scan-path will be reset by toggling the JTAG TRST signal.
The controller is the FTDI FT2232 with USB interface.
The link from controller to target is direct (without cable).
The software is configured for FTDI FT2232 features.
The controller cannot monitor the value on the EMU[0] pin.
The controller cannot monitor the value on the EMU[1] pin.
The controller cannot control the timing on output pins.
The controller cannot control the timing on input pins.
The scan-path link-delay has been set to exactly '0' (0x0000).

-----[The log-file for the JTAG TCLK output generated from the PLL]----------

There is no hardware for programming the JTAG TCLK frequency.

-----[Measure the source and frequency of the final JTAG TCLKR input]--------

There is no hardware for measuring the JTAG TCLK frequency.

-----[Perform the standard path-length test on the JTAG IR and DR]-----------

This path-length test uses blocks of 64 32-bit words.

The test for the JTAG IR instruction path-length failed.
The JTAG IR instruction scan-path is stuck-at-ones.

The test for the JTAG DR bypass path-length failed.
The JTAG DR bypass scan-path is stuck-at-ones.

-----[Perform the Integrity scan-test on the JTAG IR]------------------------

This test will use blocks of 64 32-bit words.
This test will be applied just once.

Do a test using 0xFFFFFFFF.
Scan tests: 1, skipped: 0, failed: 0
Do a test using 0x00000000.
Test 2 Word 0: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 1: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 2: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 3: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 4: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 5: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 6: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 7: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
The details of the first 8 errors have been provided.
The utility will now report only the count of failed tests.
Scan tests: 2, skipped: 0, failed: 1
Do a test using 0xFE03E0E2.
Scan tests: 3, skipped: 0, failed: 2
Do a test using 0x01FC1F1D.
Scan tests: 4, skipped: 0, failed: 3
Do a test using 0x5533CCAA.
Scan tests: 5, skipped: 0, failed: 4
Do a test using 0xAACC3355.
Scan tests: 6, skipped: 0, failed: 5
Some of the values were corrupted - 83.3 percent.

The JTAG IR Integrity scan-test has failed.

-----[Perform the Integrity scan-test on the JTAG DR]------------------------

This test will use blocks of 64 32-bit words.
This test will be applied just once.

Do a test using 0xFFFFFFFF.
Scan tests: 1, skipped: 0, failed: 0
Do a test using 0x00000000.
Test 2 Word 0: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 1: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 2: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 3: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 4: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 5: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 6: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 7: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
The details of the first 8 errors have been provided.
The utility will now report only the count of failed tests.
Scan tests: 2, skipped: 0, failed: 1
Do a test using 0xFE03E0E2.
Scan tests: 3, skipped: 0, failed: 2
Do a test using 0x01FC1F1D.
Scan tests: 4, skipped: 0, failed: 3
Do a test using 0x5533CCAA.
Scan tests: 5, skipped: 0, failed: 4
Do a test using 0xAACC3355.
Scan tests: 6, skipped: 0, failed: 5
Some of the values were corrupted - 83.3 percent.

The JTAG DR Integrity scan-test has failed.

[End: Texas Instruments XDS100v2 USB Debug Probe_0]

    TMS320F28386S_TC.txt 
    <?xml version="1.0" encoding="UTF-8" standalone="no"?>
<configurations XML_version="1.2" id="configurations_0">
    
    <configuration XML_version="1.2" id="Texas Instruments XDS100v2 USB Debug Probe_0">
        <instance XML_version="1.2" desc="Texas Instruments XDS100v2 USB Debug Probe_0" href="connections/TIXDS100v2_Connection.xml" id="Texas Instruments XDS100v2 USB Debug Probe_0" xml="TIXDS100v2_Connection.xml" xmlpath="connections"/>
        <connection XML_version="1.2" id="Texas Instruments XDS100v2 USB Debug Probe_0">
            <instance XML_version="1.2" href="drivers/tixds100v2icepick_c.xml" id="drivers" xml="tixds100v2icepick_c.xml" xmlpath="drivers"/>
            <instance XML_version="1.2" href="drivers/tixds100v2c28x.xml" id="drivers" xml="tixds100v2c28x.xml" xmlpath="drivers"/>
            <instance XML_version="1.2" href="drivers/tixds100v2cla2.xml" id="drivers" xml="tixds100v2cla2.xml" xmlpath="drivers"/>
            <instance XML_version="1.2" href="drivers/tixds100v2cs_child.xml" id="drivers" xml="tixds100v2cs_child.xml" xmlpath="drivers"/>
            <instance XML_version="1.2" href="drivers/tixds100v2cs_dap.xml" id="drivers" xml="tixds100v2cs_dap.xml" xmlpath="drivers"/>
            <instance XML_version="1.2" href="drivers/tixds100v2cortexM.xml" id="drivers" xml="tixds100v2cortexM.xml" xmlpath="drivers"/>
            <instance XML_version="1.2" href="drivers/tixds510ajsm.xml" id="drivers" xml="tixds510ajsm.xml" xmlpath="drivers"/>
            <platform XML_version="1.2" id="platform_0">
                <instance XML_version="1.2" desc="TMS320F28386S_0" href="devices/f28386s.xml" id="TMS320F28386S_0" xml="f28386s.xml" xmlpath="devices"/>
                <device HW_revision="1" XML_version="1.2" description="" id="TMS320F28386S_0" partnum="TMS320F28386S">
                    <router HW_revision="1.0" XML_version="1.2" description="ICEPick_C router" id="IcePick_C_0" isa="ICEPICK_C">
                        <subpath id="CM">
                            <property Type="numericfield" Value="0x12" desc="Port Number_0" id="Port Number"/>
                        </subpath>
                    </router>
                </device>
            </platform>
        </connection>
    </configuration>
</configurations>

  • 0 in reply to Vishal D
    TI__Genius 17070 points

    Hi,

    You are correct, you would also need the ground signal. Your target configuration file looks correct. 

    There are a lot of things that could cause problems when trying to do something like this. Please take a look at this page: https://software-dl.ti.com/ccs/esd/documents/xdsdebugprobes/emu_xds_target_connection_guide.html#buffered-case

    One thing that could cause this issue would be the length of the JTAG signal traces/wires, which should not exceed 6 inches. Could you also try lowering the TCK frequency in the advanced tab of your target configuration?

    I would recommend that you buy a standalone JTAG debug probe if you are able, since it will be much easier to use. In the link above, there is a list of JTAG Debug Probes that would work for C2000 devices. 

    Best Regards,

    Ben Collier

  • 0 in reply to Benjamin Collier
    Prodigy 70 points

    Hello Ben, Thank you again for all these suggestions. I am able to connect to my board with ControlCard debugger probe. I had added series resistor of 22E with all JTAG signals after removing those the issue is resolved. 

  • 0 in reply to Vishal D
    TI__Genius 17070 points

    Ok, I am glad your issue is resolved.