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TMS320F28377S-Q1: operating temperature and qualification test

Part Number: TMS320F28377S-Q1

I am currently having new design and looking forward to use one of C2000 line processor: TMS320F2837xS.

 

I looked into the datasheet of TMS320F2837xS, and the temperature rating for the *28377S-Q1 device is shown as -40c to 150C (junction temp) and -40c to 125C (free-air temp), which looks to be matching with the design requirement that I have.

I am wondering if there is any more temperature qualification data related to the processor family. also, is it okay to run the two cores at 200 MHz at 150°C?

Thanks. 

  • Hello Junchao,

    I am wondering if there is any more temperature qualification data related to the processor family.

    The datasheet provides the ambient temperature and junction temperature, can you specify what sort of temperature qualification data you are looking for? Are you asking about how we test for temperature on a device?

    also, is it okay to run the two cores at 200 MHz at 150°C?

    Looking at the datasheet the only the junction temperature for the Q version of the F2837xD device would qualify for this, it will not meet this requirement with regards to ambient temperature:

    I believe devices are tested at various settings such as frequency, but I will forward this question to another expert who may be able to explain more.

    Best regards,

    Omer Amir

  • To add what Omer said, anything in the DS that is specified as MAX/MIN has been verified/characterized across the listed temperature range of the device for the useful lifetime of the device.

    I would also recommend looking at this application report https://www.ti.com/lit/sprabx4.  This gives some insight on how to calculate the  useful lifetime of our devices based on your mission profile. 

    All of C2000 MCUs are rated for a useful lifetime of 100k power on hours at 105C T junction.  While this device is fully supported at 150C T junction if the device is running 100% of its power on time at that temperature(which would be unusual in an industrial/automotive setting) its useful lifetime will be less than the above.

    Best,

    Matthew

  • Hi Omer, 

    Really appreciate your reply. 

    The datasheet provides the ambient temperature and junction temperature, can you specify what sort of temperature qualification data you are looking for? Are you asking about how we test for temperature on a device?

    Yes, I was looking for some details how the processor has been qualified like at what temperature and for how long been tested, any derating factor is available when operating above 150C junction (or 125C ambient). Have the processors been tested under different packages? Based on my experience, mostly the time, the failure is caused by the package, not the die. 

    Looking at the datasheet the only the junction temperature for the Q version of the F2837xD device would qualify for this, it will not meet this requirement with regards to ambient temperature:

    is there any derating factor that I can use to calculate the lifetime if the temperature is above 150C Junction or 125C ambient.

  • Hi Matthew, 

    Thanks for sharing the application report for lifetime calculation. 

    Like I said in my reply to Omer, I would be very interested in the derating factor when its operating beyond 125C ambient temperature, which is not in the application report. 

    Thanks.
    Junchao 

  • Junchao,

    Would you be able to share your mission profile, i.e. expected power on hours at different temperatures?  This device is capable of 150C Tj, as you noted, but anything outside of the DS spec we can't guarantee functionally. 

    I need to check on the Ta limit, I'm fairly certain there is no way to hit that  Tj if that were strictly enforced

    Best,
    Matthew