We recently used F2800157QPMR master controller of TI with CSTNE20M0VH3C000R0 ceramic crystal oscillator of Murata. During the crystal oscillator waveform test, we found that the crystal oscillator waveform amplitude of X1 and X2 channels was quite different, and the crystal oscillator amplitude of X1 was close to the amplitude boundary of the data sheet. Please help us analyze this problem.
The schematic and layout are as follows: CH1:POWER CH2:X1 CH3: X2
The waveform is as follows:
R501 68R
R501 Change to 0R
R501 Change to 10R
R501 Change to 30R
R501 Change to 51R
R501 Change to 82R
R501 Change to 100R
R501 Change to 120R
Exchange CH2 and CH3 measurement results
Currently, this phenomenon has been found in many PCBAs of two products, and we have done probe cross verification, confirming that it is not caused by probe difference. Please help analyze the cause of the fault, and please contact us in time if you need to provide other test data.