Tool/software:
Hi, experts,
I am asking this question on behave of my customer.
Customers are using the TMS320F280048 chip on their products. During the product development phase, they carried out stress tests of FLASH erase, the number of erase was 500, the erase time of 12 sectors was on average around 150ms, and the erase time of each sector was not very different. This product has been produced in millions of units, but only one is currently having a problem: The car has only a few hundred kilometers and the flash erase time is less than five times, but the time to erase 12 sectors has reached 388ms, far exceeding the erase time of previous tests. They then tested the flash erase time of a sector (8kb) of the chip, and found the time between 22ms and 60ms. Although the erase time for the single sector of this chip is in the range of datasheets, they think the difference in this time is too big and not the same as their previous test results, so they want to confirm the following issues:
- Flash erase time is related to what factors, the data of table 7-10 is based on how many samples and what test conditions are obtained；
- How does flash erase time relate to the number of erase, whether it is a clipping growth or a linear growth
