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C28xx: Error connecting to the target: (Error -1135 @ 0x0)

Sivagunalan Sivanathan
Prodigy 30 points
Other Parts Discussed in Thread: TMDSCNCD28035ISO, TMS320F28035, CONTROLSUITE, UNIFLASH

Hi,
I recently bought a TMDSCNCD28035ISO to test the TI DC-DC Reference design found in www.ti.com/.../tidm-buckboost-bidir;tisearch=Search-EN-Everything#Technical

I manage to compile the sample code with no errors and when i try to debug/programe the CONTROL CARD PICCOLO ISO F28035 i am getting the following error

"C28xx: Error connecting to the target: (Error -1135 @ 0x0) The debug probe reported an error. Confirm debug probe configuration and connections, reset the debug probe, and retry the operation. (Emulation package 5.1.641.0)"

i came across this form and try to figure out any thing I missed in terms of software setting but it seems to be fine for me.

e2e.ti.com/.../340440

I also did the connection test and got the following messages


[Start: Texas Instruments XDS100v1 USB Debug Probe_0]

Execute the command:

%ccs_base%/common/uscif/dbgjtag -f %boarddatafile% -rv -o -F inform,logfile=yes -S pathlength -S integrity

[Result]


-----[Print the board config pathname(s)]------------------------------------

C:\Users\cepeeng\AppData\Local\TEXASI~1\
CCS\ti\0\0\BrdDat\testBoard.dat

-----[Print the reset-command software log-file]-----------------------------

This utility has selected a 100- or 510-class product.
This utility will load the adapter 'jioserdesusb.dll'.
The library build date was 'Feb 18 2015'.
The library build time was '23:56:50'.
The library package version is '5.1.641.0'.
The library component version is '35.34.40.0'.
The controller does not use a programmable FPGA.
The controller has a version number of '4' (0x00000004).
The controller has an insertion length of '0' (0x00000000).
This utility will attempt to reset the controller.
This utility has successfully reset the controller.

-----[Print the reset-command hardware log-file]-----------------------------

The scan-path will be reset by toggling the JTAG TRST signal.
The controller is the FTDI FT2232 with USB interface.
The link from controller to target is direct (without cable).
The software is configured for FTDI FT2232 features.
The controller cannot monitor the value on the EMU[0] pin.
The controller cannot monitor the value on the EMU[1] pin.
The controller cannot control the timing on output pins.
The controller cannot control the timing on input pins.
The scan-path link-delay has been set to exactly '0' (0x0000).

-----[The log-file for the JTAG TCLK output generated from the PLL]----------

There is no hardware for programming the JTAG TCLK frequency.

-----[Measure the source and frequency of the final JTAG TCLKR input]--------

There is no hardware for measuring the JTAG TCLK frequency.

-----[Perform the standard path-length test on the JTAG IR and DR]-----------

This path-length test uses blocks of 512 32-bit words.

The test for the JTAG IR instruction path-length failed.
The JTAG IR instruction scan-path is stuck-at-ones.

The test for the JTAG DR bypass path-length failed.
The JTAG DR bypass scan-path is stuck-at-ones.

-----[Perform the Integrity scan-test on the JTAG IR]------------------------

This test will use blocks of 512 32-bit words.
This test will be applied just once.

Do a test using 0xFFFFFFFF.
Scan tests: 1, skipped: 0, failed: 0
Do a test using 0x00000000.
Test 2 Word 0: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 1: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 2: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 3: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 4: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 5: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 6: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 7: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
The details of the first 8 errors have been provided.
The utility will now report only the count of failed tests.
Scan tests: 2, skipped: 0, failed: 1
Do a test using 0xFE03E0E2.
Scan tests: 3, skipped: 0, failed: 2
Do a test using 0x01FC1F1D.
Scan tests: 4, skipped: 0, failed: 3
Do a test using 0x5533CCAA.
Scan tests: 5, skipped: 0, failed: 4
Do a test using 0xAACC3355.
Scan tests: 6, skipped: 0, failed: 5
Some of the values were corrupted - 83.3 percent.

The JTAG IR Integrity scan-test has failed.

-----[Perform the Integrity scan-test on the JTAG DR]------------------------

This test will use blocks of 512 32-bit words.
This test will be applied just once.

Do a test using 0xFFFFFFFF.
Scan tests: 1, skipped: 0, failed: 0
Do a test using 0x00000000.
Test 2 Word 0: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 1: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 2: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 3: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 4: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 5: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 6: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 7: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
The details of the first 8 errors have been provided.
The utility will now report only the count of failed tests.
Scan tests: 2, skipped: 0, failed: 1
Do a test using 0xFE03E0E2.
Scan tests: 3, skipped: 0, failed: 2
Do a test using 0x01FC1F1D.
Scan tests: 4, skipped: 0, failed: 3
Do a test using 0x5533CCAA.
Scan tests: 5, skipped: 0, failed: 4
Do a test using 0xAACC3355.
Scan tests: 6, skipped: 0, failed: 5
Some of the values were corrupted - 83.3 percent.

The JTAG DR Integrity scan-test has failed.

[End: Texas Instruments XDS100v1 USB Debug Probe_0]


I understand that i have to turn on the SW2 and both SW3 but it didn't solve the problem.

Is this because of the hardware problem? or some thing else?

please help.

thank you.

Gunalan.

  • 0
    Guru 192875 points

    Hi Gunalan,

    Yes, the boot switches are critical here. Please go through  this doc:

    F28035_ISOcontrolCAR-InfoSheet.pdf

    Also, try replacing the data cable. Check your target configuration.

    Regards,

    Gautam

  • 0 in reply to Gautam Iyer
    Prodigy 30 points
    Hi Gautam,

    Thanks for your reply,

    I double checked the both SW2 and SW3, they are all switched to on position.

    As said in the above document, LD1 is a power indicator that has to be turn on when the control card is powered. In my case, this LED remained off even i plug the USB cable(I suppose this control card is powered from USB).

    It didn't helped when I tried different data cable including the shorter one(<80cm).

    My target configuration is as below.

    under basic tab

    Connection Texas Instruments XDS100v1 USB Debug Probe
    Board Or Device : TMS320F28035 (I also tried Experimenter's Kit -Piccolo F28035 )

    under Advanced tab, i able to find
    Texas Instruments XDS100v1 USB Debug Probe_0
    TMS320F28035_0
    C28xx
    CLA_0
    I believe these are appropriate settings.

    Thanks
    Gunalan
  • 0 in reply to Sivagunalan Sivanathan
    Intellectual 330 points

    I have exact the same problem for my "Experimenter’s Kit USB Docking Station" with the control card "F28027 Piccolo Family" .

    You could find solution to your problem?

  • 0 in reply to Rui Carvalho76
    Guru 192875 points
    Did you check your SWITCH SW1 boot settings? They should be in ON position. Also, check the schematics :
    C:\ti\controlSUITE\development_kits\~controlCARDs\CC2802xHWdevPkg

    Regards,
    Gautam
  • 0 in reply to Gautam Iyer
    Intellectual 330 points

    In the first times i program my ExperimentersKit Piccolo  F28027 with the Flashing LEDs Project and debug, all is ok.

    But in the next time i program my ExperimentersKit Piccolo  F28027 with TI-RTOS example "Task Example" and, the build return the error marked at red.

    After that I questioned this forum (here: )

    why came this error, and according to the answer given to me, I chose to change the target to "ti.targets.c28_large", (blue in the next image).

    After this i build the project with no errors or warnings, and try debugging, but the debugging failed.

    After that I could not do the debugging of any program (FlashingLeds, Task Example or otherwise), always getting the error that can see in the following image.

    any solution?

     

  • 0 in reply to Rui Carvalho76
    Guru 192875 points
    Is your target configuration setting correct?
  • 0 in reply to Gautam Iyer
    Intellectual 330 points

    My Test Connection report this:

    [Start: Texas Instruments XDS100v1 USB Debug Probe_0]

    Execute the command:

    %ccs_base%/common/uscif/dbgjtag -f %boarddatafile% -rv -o -F inform,logfile=yes -S pathlength -S integrity

    [Result]


    -----[Print the board config pathname(s)]------------------------------------

    C:\Users\Cesar\AppData\Local\TEXASI~1\CCS\
        ti\0\0\BrdDat\testBoard.dat

    -----[Print the reset-command software log-file]-----------------------------

    This utility has selected a 100- or 510-class product.
    This utility will load the adapter 'jioserdesusb.dll'.
    The library build date was 'Feb 18 2015'.
    The library build time was '23:56:50'.
    The library package version is '5.1.641.0'.
    The library component version is '35.34.40.0'.
    The controller does not use a programmable FPGA.
    The controller has a version number of '4' (0x00000004).
    The controller has an insertion length of '0' (0x00000000).
    This utility will attempt to reset the controller.
    This utility has successfully reset the controller.

    -----[Print the reset-command hardware log-file]-----------------------------

    The scan-path will be reset by toggling the JTAG TRST signal.
    The controller is the FTDI FT2232 with USB interface.
    The link from controller to target is direct (without cable).
    The software is configured for FTDI FT2232 features.
    The controller cannot monitor the value on the EMU[0] pin.
    The controller cannot monitor the value on the EMU[1] pin.
    The controller cannot control the timing on output pins.
    The controller cannot control the timing on input pins.
    The scan-path link-delay has been set to exactly '0' (0x0000).

    -----[The log-file for the JTAG TCLK output generated from the PLL]----------

    There is no hardware for programming the JTAG TCLK frequency.

    -----[Measure the source and frequency of the final JTAG TCLKR input]--------

    There is no hardware for measuring the JTAG TCLK frequency.

    -----[Perform the standard path-length test on the JTAG IR and DR]-----------

    This path-length test uses blocks of 512 32-bit words.

    The test for the JTAG IR instruction path-length failed.
    The JTAG IR instruction scan-path is stuck-at-ones.

    The test for the JTAG DR bypass path-length failed.
    The JTAG DR bypass scan-path is stuck-at-ones.

    -----[Perform the Integrity scan-test on the JTAG IR]------------------------

    This test will use blocks of 512 32-bit words.
    This test will be applied just once.

    Do a test using 0xFFFFFFFF.
    Scan tests: 1, skipped: 0, failed: 0
    Do a test using 0x00000000.
    Test 2 Word 0: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 1: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 2: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 3: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 4: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 5: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 6: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 7: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    The details of the first 8 errors have been provided.
    The utility will now report only the count of failed tests.
    Scan tests: 2, skipped: 0, failed: 1
    Do a test using 0xFE03E0E2.
    Scan tests: 3, skipped: 0, failed: 2
    Do a test using 0x01FC1F1D.
    Scan tests: 4, skipped: 0, failed: 3
    Do a test using 0x5533CCAA.
    Scan tests: 5, skipped: 0, failed: 4
    Do a test using 0xAACC3355.
    Scan tests: 6, skipped: 0, failed: 5
    Some of the values were corrupted - 83.3 percent.

    The JTAG IR Integrity scan-test has failed.

    -----[Perform the Integrity scan-test on the JTAG DR]------------------------

    This test will use blocks of 512 32-bit words.
    This test will be applied just once.

    Do a test using 0xFFFFFFFF.
    Scan tests: 1, skipped: 0, failed: 0
    Do a test using 0x00000000.
    Test 2 Word 0: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 1: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 2: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 3: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 4: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 5: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 6: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 7: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    The details of the first 8 errors have been provided.
    The utility will now report only the count of failed tests.
    Scan tests: 2, skipped: 0, failed: 1
    Do a test using 0xFE03E0E2.
    Scan tests: 3, skipped: 0, failed: 2
    Do a test using 0x01FC1F1D.
    Scan tests: 4, skipped: 0, failed: 3
    Do a test using 0x5533CCAA.
    Scan tests: 5, skipped: 0, failed: 4
    Do a test using 0xAACC3355.
    Scan tests: 6, skipped: 0, failed: 5
    Some of the values were corrupted - 83.3 percent.

    The JTAG DR Integrity scan-test has failed.

    [End: Texas Instruments XDS100v1 USB Debug Probe_0]

  • 0 in reply to Rui Carvalho76
    Guru 192875 points

    Can you check your .ccxml file? What emulator and device are selected? Check with XDS100v2 once whether that works for you or not.

  • 0 in reply to Gautam Iyer
    Intellectual 330 points

    I'm wearing one:
    -Docking Stn-USB-EMU [R3] and f2802xx (Piccollo -A) controlCARD with F28027.
    My OS is:
    - Windows 7 x64
    The CCS IS:
    - 6.1

    Initially I could program using XDS100V1 to try to set the example in TI-RTOS.
    I do not know I'm new to texas, but I think I must have changed the internal clock that is used by JTAG. Probably I will need to reconfigure this internal clock to its factory settings, but I do not know how to do.

    In this post you sugest use uniflash:

    But in my case the uniflash not install de GUI



    The test result by selecting XDS100V2 debug prob:

    [Start: Texas Instruments XDS100v2 USB Debug Probe_0]

    Execute the command:

    %ccs_base%/common/uscif/dbgjtag -f %boarddatafile% -rv -o -F inform,logfile=yes -S pathlength -S integrity

    [Result]


    -----[Print the board config pathname(s)]------------------------------------

    C:\Users\Cesar\AppData\Local\TEXASI~1\CCS\
        ti\0\0\BrdDat\testBoard.dat

    -----[Print the reset-command software log-file]-----------------------------

    This utility has selected a 100- or 510-class product.
    This utility will load the adapter 'jioserdesusb.dll'.
    The library build date was 'Feb 18 2015'.
    The library build time was '23:56:50'.
    The library package version is '5.1.641.0'.
    The library component version is '35.34.40.0'.
    The controller does not use a programmable FPGA.
    The controller has a version number of '4' (0x00000004).
    The controller has an insertion length of '0' (0x00000000).
    This utility will attempt to reset the controller.
    This utility has successfully reset the controller.

    -----[Print the reset-command hardware log-file]-----------------------------

    The scan-path will be reset by toggling the JTAG TRST signal.
    The controller is the FTDI FT2232 with USB interface.
    The link from controller to target is direct (without cable).
    The software is configured for FTDI FT2232 features.
    The controller cannot monitor the value on the EMU[0] pin.
    The controller cannot monitor the value on the EMU[1] pin.
    The controller cannot control the timing on output pins.
    The controller cannot control the timing on input pins.
    The scan-path link-delay has been set to exactly '0' (0x0000).

    -----[The log-file for the JTAG TCLK output generated from the PLL]----------

    There is no hardware for programming the JTAG TCLK frequency.

    -----[Measure the source and frequency of the final JTAG TCLKR input]--------

    There is no hardware for measuring the JTAG TCLK frequency.

    -----[Perform the standard path-length test on the JTAG IR and DR]-----------

    This path-length test uses blocks of 512 32-bit words.

    The test for the JTAG IR instruction path-length failed.
    The JTAG IR instruction scan-path is stuck-at-ones.

    The test for the JTAG DR bypass path-length failed.
    The JTAG DR bypass scan-path is stuck-at-ones.

    -----[Perform the Integrity scan-test on the JTAG IR]------------------------

    This test will use blocks of 512 32-bit words.
    This test will be applied just once.

    Do a test using 0xFFFFFFFF.
    Scan tests: 1, skipped: 0, failed: 0
    Do a test using 0x00000000.
    Test 2 Word 0: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 1: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 2: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 3: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 4: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 5: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 6: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 7: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    The details of the first 8 errors have been provided.
    The utility will now report only the count of failed tests.
    Scan tests: 2, skipped: 0, failed: 1
    Do a test using 0xFE03E0E2.
    Scan tests: 3, skipped: 0, failed: 2
    Do a test using 0x01FC1F1D.
    Scan tests: 4, skipped: 0, failed: 3
    Do a test using 0x5533CCAA.
    Scan tests: 5, skipped: 0, failed: 4
    Do a test using 0xAACC3355.
    Scan tests: 6, skipped: 0, failed: 5
    Some of the values were corrupted - 83.3 percent.

    The JTAG IR Integrity scan-test has failed.

    -----[Perform the Integrity scan-test on the JTAG DR]------------------------

    This test will use blocks of 512 32-bit words.
    This test will be applied just once.

    Do a test using 0xFFFFFFFF.
    Scan tests: 1, skipped: 0, failed: 0
    Do a test using 0x00000000.
    Test 2 Word 0: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 1: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 2: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 3: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 4: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 5: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 6: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 7: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    The details of the first 8 errors have been provided.
    The utility will now report only the count of failed tests.
    Scan tests: 2, skipped: 0, failed: 1
    Do a test using 0xFE03E0E2.
    Scan tests: 3, skipped: 0, failed: 2
    Do a test using 0x01FC1F1D.
    Scan tests: 4, skipped: 0, failed: 3
    Do a test using 0x5533CCAA.
    Scan tests: 5, skipped: 0, failed: 4
    Do a test using 0xAACC3355.
    Scan tests: 6, skipped: 0, failed: 5
    Some of the values were corrupted - 83.3 percent.

    The JTAG DR Integrity scan-test has failed.

    [End: Texas Instruments XDS100v2 USB Debug Probe_0]

  • 0 in reply to Rui Carvalho76
    Guru 192875 points
    You can download CCS uniflash from here: processors.wiki.ti.com/.../CC3200_Edition

    Regards,
    Gautam
  • 0 in reply to Gautam Iyer
    Intellectual 330 points

    This is not compatible with F28027, because is family c2000!

    I installed uniflash 2.0.0 and it returns the same error.


  • 0 in reply to Rui Carvalho76
    Guru 192875 points
    Its very well compatible. Is your device locked by any chance?

    Regards,
    Gautam
  • 0 in reply to Gautam Iyer
    Intellectual 330 points


    I do not know if it is blocked, how can I see it?

    In addition to all the problems already mentioned above, when compiling using as target FLASH, I get errors that may in the following figure.

  • 0 in reply to Rui Carvalho76
    Guru 192875 points
    There seems to be an issue with the linker file. I hope you're importing examples from:
    C:\ti\controlSUITE\device_support\f2802x\v129\DSP2802x_examples_ccsv4

    Regards,
    Gautam
  • 0 in reply to Gautam Iyer
    Intellectual 330 points

    I use this:

    and i try build an example in the location you mentioned and result this:

  • 0 in reply to Rui Carvalho76
    Guru 192875 points
    I can see that you project has 2 cmd files delete "28027_RAM_Ink.cmd" from your project if you've enabled flash configuration.

    Regards,
    Gautam
  • 0 in reply to Gautam Iyer
    Intellectual 330 points

    I have deleted "28027_RAM_Ink.cmd" and the build is ok at this moment with, no errors! :)

    The connection have the same problem,
    Now I tested the two commands that can be seen in the figure below

    And I installed a virtual machine with XP and CCS3.3, where I captured the following test figures:

    Reading EEprom with FTDI - FT Prog 3.0.56

    Test Connection , before removing de controlCARD F2802XX

    Test Connection in CCS6.1 after removing the controlCARD F2802xx, the socket of the Docking Station USB-EMU [R3].
    Note: In my view, the test result is the same when the controlCARD this seated in the socket.

    [Start: Texas Instruments XDS100v1 USB Debug Probe]

    Execute the command:

    %ccs_base%/common/uscif/dbgjtag -f %boarddatafile% -rv -o -F inform,logfile=yes -S pathlength -S integrity

    [Result]


    -----[Print the board config pathname(s)]------------------------------------

    C:\Users\Cesar\AppData\Local\TEXASI~1\CCS\
        ti\0\0\BrdDat\testBoard.dat

    -----[Print the reset-command software log-file]-----------------------------

    This utility has selected a 100- or 510-class product.
    This utility will load the adapter 'jioserdesusb.dll'.
    The library build date was 'Feb 18 2015'.
    The library build time was '23:56:50'.
    The library package version is '5.1.641.0'.
    The library component version is '35.34.40.0'.
    The controller does not use a programmable FPGA.
    The controller has a version number of '4' (0x00000004).
    The controller has an insertion length of '0' (0x00000000).
    This utility will attempt to reset the controller.
    This utility has successfully reset the controller.

    -----[Print the reset-command hardware log-file]-----------------------------

    The scan-path will be reset by toggling the JTAG TRST signal.
    The controller is the FTDI FT2232 with USB interface.
    The link from controller to target is direct (without cable).
    The software is configured for FTDI FT2232 features.
    The controller cannot monitor the value on the EMU[0] pin.
    The controller cannot monitor the value on the EMU[1] pin.
    The controller cannot control the timing on output pins.
    The controller cannot control the timing on input pins.
    The scan-path link-delay has been set to exactly '0' (0x0000).

    -----[The log-file for the JTAG TCLK output generated from the PLL]----------

    There is no hardware for programming the JTAG TCLK frequency.

    -----[Measure the source and frequency of the final JTAG TCLKR input]--------

    There is no hardware for measuring the JTAG TCLK frequency.

    -----[Perform the standard path-length test on the JTAG IR and DR]-----------

    This path-length test uses blocks of 512 32-bit words.

    The test for the JTAG IR instruction path-length failed.
    The JTAG IR instruction scan-path is stuck-at-ones.

    The test for the JTAG DR bypass path-length failed.
    The JTAG DR bypass scan-path is stuck-at-ones.

    -----[Perform the Integrity scan-test on the JTAG IR]------------------------

    This test will use blocks of 512 32-bit words.
    This test will be applied just once.

    Do a test using 0xFFFFFFFF.
    Scan tests: 1, skipped: 0, failed: 0
    Do a test using 0x00000000.
    Test 2 Word 0: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 1: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 2: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 3: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 4: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 5: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 6: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 7: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    The details of the first 8 errors have been provided.
    The utility will now report only the count of failed tests.
    Scan tests: 2, skipped: 0, failed: 1
    Do a test using 0xFE03E0E2.
    Scan tests: 3, skipped: 0, failed: 2
    Do a test using 0x01FC1F1D.
    Scan tests: 4, skipped: 0, failed: 3
    Do a test using 0x5533CCAA.
    Scan tests: 5, skipped: 0, failed: 4
    Do a test using 0xAACC3355.
    Scan tests: 6, skipped: 0, failed: 5
    Some of the values were corrupted - 83.3 percent.

    The JTAG IR Integrity scan-test has failed.

    -----[Perform the Integrity scan-test on the JTAG DR]------------------------

    This test will use blocks of 512 32-bit words.
    This test will be applied just once.

    Do a test using 0xFFFFFFFF.
    Scan tests: 1, skipped: 0, failed: 0
    Do a test using 0x00000000.
    Test 2 Word 0: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 1: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 2: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 3: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 4: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 5: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 6: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 7: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    The details of the first 8 errors have been provided.
    The utility will now report only the count of failed tests.
    Scan tests: 2, skipped: 0, failed: 1
    Do a test using 0xFE03E0E2.
    Scan tests: 3, skipped: 0, failed: 2
    Do a test using 0x01FC1F1D.
    Scan tests: 4, skipped: 0, failed: 3
    Do a test using 0x5533CCAA.
    Scan tests: 5, skipped: 0, failed: 4
    Do a test using 0xAACC3355.
    Scan tests: 6, skipped: 0, failed: 5
    Some of the values were corrupted - 83.3 percent.

    The JTAG DR Integrity scan-test has failed.

    [End: Texas Instruments XDS100v1 USB Debug Probe]

  • 0 in reply to Rui Carvalho76
    Guru 192875 points

    Rui Carvalho76 said:
    I have deleted "28027_RAM_Ink.cmd" and the build is ok at this moment with, no errors! :)

    Excellent! So you're left with some board connection issue. When you try to debug the board what error do you get now? Also, if possible send the pic of your setup with controlCard info.

    Regards,

    Gautam

  • 0 in reply to Gautam Iyer
    Intellectual 330 points

    I get the same error:

    Console:

    --------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------

    C28xx: Error connecting to the target: (Error -1015 @ 0x0) Device is not responding to the request.  Device may be locked, or the debug probe connection may be unreliable. Unlock the device if possible (e.g. use wait in reset mode, and power-cycle the board). If error persists, confirm configuration and/or try more reliable JTAG settings (e.g. lower TCLK). (Emulation package 5.1.641.0)

    C28xx: Error connecting to the target: (Error -1135 @ 0x0) The debug probe reported an error. Confirm debug probe configuration and connections, reset the debug probe, and retry the operation. (Emulation package 5.1.641.0)

    C28xx: Error: (Error -1135 @ 0x0) The debug probe reported an error. Confirm debug probe configuration and connections, reset the debug probe, and retry the operation. (Emulation package 5.1.641.0)
    C28xx: Unable to determine target status after 20 attempts
    C28xx: Failed to remove the debug state from the target before disconnecting.  There may still be breakpoint op-codes embedded in program memory.  It is recommended that you reset the emulator before you connect and reload your program before you continue debugging
    C28xx: GEL: Error while executing OnTargetConnect(): Could not read register ST1: target is not connected
        at (ST1&~(0x0100)) [f28027.gel:272]
        at C28x_Mode() [f28027.gel:80]
        at OnTargetConnect()

    ----------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------

    Picture of my kit connected to PC:


  • 0 in reply to Rui Carvalho76
    Guru 192875 points

    Can you verify your switch positioning?

    Regards,

    Gautam

  • 0 in reply to Gautam Iyer
    Intellectual 330 points

    Now I was testing a different configuration for SW1 of controlCARD, which can be seen below.

    SW1 (BOOT)

    1-ON 2-OFF

    After making this change to SW1 in CCS6.1 and run "Test Connection" I get the following result:

    -----------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------

    [Start: Texas Instruments XDS100v1 USB Debug Probe_0]

    Execute the command:

    %ccs_base%/common/uscif/dbgjtag -f %boarddatafile% -rv -o -F inform,logfile=yes -S pathlength -S integrity

    [Result]


    -----[Print the board config pathname(s)]------------------------------------

    C:\Users\Cesar\AppData\Local\TEXASI~1\CCS\
        ti\0\0\BrdDat\testBoard.dat

    -----[Print the reset-command software log-file]-----------------------------

    This utility has selected a 100- or 510-class product.
    This utility will load the adapter 'jioserdesusb.dll'.
    The library build date was 'Feb 18 2015'.
    The library build time was '23:56:50'.
    The library package version is '5.1.641.0'.
    The library component version is '35.34.40.0'.
    The controller does not use a programmable FPGA.
    The controller has a version number of '4' (0x00000004).
    The controller has an insertion length of '0' (0x00000000).
    This utility will attempt to reset the controller.
    This utility has successfully reset the controller.

    -----[Print the reset-command hardware log-file]-----------------------------

    The scan-path will be reset by toggling the JTAG TRST signal.
    The controller is the FTDI FT2232 with USB interface.
    The link from controller to target is direct (without cable).
    The software is configured for FTDI FT2232 features.
    The controller cannot monitor the value on the EMU[0] pin.
    The controller cannot monitor the value on the EMU[1] pin.
    The controller cannot control the timing on output pins.
    The controller cannot control the timing on input pins.
    The scan-path link-delay has been set to exactly '0' (0x0000).

    -----[The log-file for the JTAG TCLK output generated from the PLL]----------

    There is no hardware for programming the JTAG TCLK frequency.

    -----[Measure the source and frequency of the final JTAG TCLKR input]--------

    There is no hardware for measuring the JTAG TCLK frequency.

    -----[Perform the standard path-length test on the JTAG IR and DR]-----------

    This path-length test uses blocks of 512 32-bit words.

    The test for the JTAG IR instruction path-length succeeded.
    The JTAG IR instruction path-length is 38 bits.

    The test for the JTAG DR bypass path-length succeeded.
    The JTAG DR bypass path-length is 1 bits.

    -----[Perform the Integrity scan-test on the JTAG IR]------------------------

    This test will use blocks of 512 32-bit words.
    This test will be applied just once.

    Do a test using 0xFFFFFFFF.
    Scan tests: 1, skipped: 0, failed: 0
    Do a test using 0x00000000.
    Scan tests: 2, skipped: 0, failed: 0
    Do a test using 0xFE03E0E2.
    Scan tests: 3, skipped: 0, failed: 0
    Do a test using 0x01FC1F1D.
    Scan tests: 4, skipped: 0, failed: 0
    Do a test using 0x5533CCAA.
    Scan tests: 5, skipped: 0, failed: 0
    Do a test using 0xAACC3355.
    Scan tests: 6, skipped: 0, failed: 0
    All of the values were scanned correctly.

    The JTAG IR Integrity scan-test has succeeded.

    -----[Perform the Integrity scan-test on the JTAG DR]------------------------

    This test will use blocks of 512 32-bit words.
    This test will be applied just once.

    Do a test using 0xFFFFFFFF.
    Scan tests: 1, skipped: 0, failed: 0
    Do a test using 0x00000000.
    Scan tests: 2, skipped: 0, failed: 0
    Do a test using 0xFE03E0E2.
    Scan tests: 3, skipped: 0, failed: 0
    Do a test using 0x01FC1F1D.
    Scan tests: 4, skipped: 0, failed: 0
    Do a test using 0x5533CCAA.
    Scan tests: 5, skipped: 0, failed: 0
    Do a test using 0xAACC3355.
    Scan tests: 6, skipped: 0, failed: 0
    All of the values were scanned correctly.

    The JTAG DR Integrity scan-test has succeeded.

    [End: Texas Instruments XDS100v1 USB Debug Probe_0]
    ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------

    When I try to start debugging get the following result:


     

    After this I tested a few things using ccs Uniflash 2.0.0.

    Program ->Save memory:

    which resulted a file of this "Save memory".

     

    After that I tried erase the "A" sector of memory, and the result can be seen below:

     

    I also tried later this mode (SW1 1-ON 2-OFF), unlock.

    unlock test result:


     

  • 0 in reply to Gautam Iyer
    Intellectual 330 points

    Switch SW2 -SW4 are in the correct position.


    In my previous post I am using the way "Wait boot"

    What I think is my only solution.

    what I can have and there is no solution for me in this case.

  • 0 in reply to Rui Carvalho76
    Guru 192875 points
    Yes, your device seems to be locked. Did you ever lock the device manually using CSM? If not then the device seems to have got permanently locked and you'll have to replace the device in this case.

    Regards,
    Gautam
  • 0 in reply to Gautam Iyer
    Intellectual 330 points

    I think this is the last project I carried to flash my F28027, I do not know exactly if I have change later.

    task28_ExperimentersKit_PiccoloF28027.rar

    Using this .rar file, you can search if i have programmed the CSM? And the used key?

    "Jerry,

    Alvaro Prieto is right. It looks like when you programmed the previous code you have locked the device. You won't be able to re-program (or) debug it unless you unlock the device.

    You can use hex2000.exe utility (Path: C:\CCStudio_v3.3\C2000\cgtools\bin) to decipher the password if you have the correct .out file you programmed. This exe should have  been already installed in your computer when you installed CCS."

  • 0 in reply to Rui Carvalho76
    Guru 192875 points
    The above rar file doesn't have the required info. You'll have to copy paste the contents of DSP2802x_CSMPasswords.asm file.
  • 0 in reply to Rui Carvalho76
    TI__Guru** 113105 points

    Hi,

    Please note that apart from programming the unknown passwords values, there are other situations as well which could LOCK the device. E.g. if there is power loss to device during Flash erase operation then this could LOCK the device.

    Just wanted to highlight this point in case you don't see the password locations getting programed in coff file.

    Regards,

    Vivek Singh

  • 0 in reply to Gautam Iyer
    Intellectual 330 points

    DSP2802x_CSMPasswords.rar

    The file that you speak.

    In my opinion these DSPs suffer from serious flaws and can easily get off/ irreparable forever!

  • 0 in reply to Rui Carvalho76
    Guru 192875 points

    After going through the above file, it is not CSM protected. The locking seems to be due to some other reason for instance power failure during flash erase and in this case you need to replace the controller itself.

    Regards,
    Gautam

  • 0 in reply to Gautam Iyer
    Intellectual 330 points

    Using "ExitBoot" it is not possible to recover the DSP, even not knowing the password?

  • 0 in reply to Rui Carvalho76
    Guru 192875 points
    Check this link: e2e.ti.com/.../597498

    Regards,
    Gautam
  • 0 in reply to Gautam Iyer
    Intellectual 330 points

    I ended up buying today a new F28027 controlCARD next week I already receive it.

    Also I have another problem, to which also needed help!

    When I try to compile a project example of TI-RTOS after importing, I get the following error:

    Also when I try to access the .cfg file also appears to me the following:

  • 0 in reply to Rui Carvalho76
    Guru 192875 points
    Hi,

    Did you go through this pdf: www.ti.com/.../spruex3o.pdf

    Regards,
    Gautam
  • 0 in reply to Gautam Iyer
    Intellectual 330 points

    At this point I already received my new F28027 controlCARD and tested, and it works fine.
    The old controlCARD still does not work!

    Thanks for help Gautam Iyer

  • 0 in reply to Rui Carvalho76
    Guru 192875 points
    Try comparing voltage levels on both the controlCards. You might be able to narrow down to the faulty component.

    Regards,
    Gautam