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exp kit dock station R3 with F28335 control card 2.2 (usb on board emulator)

shady mamdouh
Intellectual 575 points

Urgently Please,

I have the exp kit dock station R3 with F28335 control card 2.2 (usb on board emulator) but there is an error occurred when it is connected to the CCS ,so I tried another kit with my friend and I found that the problem is coming from the (control card) because I tried:

1. my dok st with his  ctrl card and it was OK 

2. my ctrl card with his dok st , the error occured, so the problem is with my ctrl card 

Also there are two Red LEDs are operated (LD2 and LD3) on my ctrl card when I connect it to laptop

Thanks in advance, 

  • 0
    Intellectual 575 points
    When connecting the ctrl card of my friend , these two LEDs do not operated as it happened with my card.
  • 0 in reply to shady mamdouh
    TI__Guru 57255 points

    Hi,

    Have you been able to connect to your F28335 controlCARD at some point in the past?  Or have you never been able to connect to it?
    FYI: LD2 and LD3 don't necessarily mean anything on start-up.


    Thank you,
    Brett

  • 0 in reply to Brett Larimore
    Intellectual 575 points
    I didn't remember but I think that it was connected once to ccs v6 then the problem happened
  • 0 in reply to shady mamdouh
    Intellectual 575 points
    Can you tell me what can I do in both cases?
    Thanks
  • 0 in reply to shady mamdouh
    TI__Guru 57255 points

    Hmm...

    Can you try setting the boot-mode pins to SCI-boot mode (set SW2 on the cCARD to Down,Up,Up,Up). 

    This will force the device to stay in the SCI boot mode and wait there until it sees something on the SCI line or until your emulator tries to connect to it (the idea being that SCI-boot mode will keep the device from jumping to flash - in case you programmed something improper into FLASH).


    Thanks,
    Brett

  • 0 in reply to Brett Larimore
    Intellectual 575 points

    Hi Brett Larimore,

    I did what you told me with an error happened when i press test connection:

    [Start: Texas Instruments XDS100v1 USB Emulator_0]

    Execute the command:

    %ccs_base%/common/uscif/dbgjtag -f %boarddatafile% -rv -o -F inform,logfile=yes -S pathlength -S integrity

    [Result]


    -----[Print the board config pathname(s)]------------------------------------

    C:\Users\eg\AppData\Local\TEXASI~1\CCS\ti\
    1\0\BrdDat\testBoard.dat

    -----[Print the reset-command software log-file]-----------------------------

    This utility has selected a 100- or 510-class product.
    This utility will load the adapter 'jioserdesusb.dll'.
    The library build date was 'May 21 2014'.
    The library build time was '17:19:59'.
    The library package version is '5.1.507.0'.
    The library component version is '35.34.40.0'.
    The controller does not use a programmable FPGA.
    The controller has a version number of '4' (0x00000004).
    The controller has an insertion length of '0' (0x00000000).
    This utility will attempt to reset the controller.
    This utility has successfully reset the controller.

    -----[Print the reset-command hardware log-file]-----------------------------

    The scan-path will be reset by toggling the JTAG TRST signal.
    The controller is the FTDI FT2232 with USB interface.
    The link from controller to target is direct (without cable).
    The software is configured for FTDI FT2232 features.
    The controller cannot monitor the value on the EMU[0] pin.
    The controller cannot monitor the value on the EMU[1] pin.
    The controller cannot control the timing on output pins.
    The controller cannot control the timing on input pins.
    The scan-path link-delay has been set to exactly '0' (0x0000).

    -----[The log-file for the JTAG TCLK output generated from the PLL]----------

    There is no hardware for programming the JTAG TCLK frequency.

    -----[Measure the source and frequency of the final JTAG TCLKR input]--------

    There is no hardware for measuring the JTAG TCLK frequency.

    -----[Perform the standard path-length test on the JTAG IR and DR]-----------

    This path-length test uses blocks of 512 32-bit words.

    The test for the JTAG IR instruction path-length failed.
    The JTAG IR instruction scan-path is stuck-at-zero.

    The test for the JTAG DR bypass path-length failed.
    The JTAG DR bypass scan-path is stuck-at-zero.

    -----[Perform the Integrity scan-test on the JTAG IR]------------------------

    This test will use blocks of 512 32-bit words.
    This test will be applied just once.

    Do a test using 0xFFFFFFFF.
    Test 1 Word 0: scanned out 0xFFFFFFFF and scanned in 0x00000000.
    Test 1 Word 1: scanned out 0xFFFFFFFF and scanned in 0x00000000.
    Test 1 Word 2: scanned out 0xFFFFFFFF and scanned in 0x00000000.
    Test 1 Word 3: scanned out 0xFFFFFFFF and scanned in 0x00000000.
    Test 1 Word 4: scanned out 0xFFFFFFFF and scanned in 0x00000000.
    Test 1 Word 5: scanned out 0xFFFFFFFF and scanned in 0x00000000.
    Test 1 Word 6: scanned out 0xFFFFFFFF and scanned in 0x00000000.
    Test 1 Word 7: scanned out 0xFFFFFFFF and scanned in 0x00000000.
    The details of the first 8 errors have been provided.
    The utility will now report only the count of failed tests.
    Scan tests: 1, skipped: 0, failed: 1
    Do a test using 0x00000000.
    Scan tests: 2, skipped: 0, failed: 1
    Do a test using 0xFE03E0E2.
    Scan tests: 3, skipped: 0, failed: 2
    Do a test using 0x01FC1F1D.
    Scan tests: 4, skipped: 0, failed: 3
    Do a test using 0x5533CCAA.
    Scan tests: 5, skipped: 0, failed: 4
    Do a test using 0xAACC3355.
    Scan tests: 6, skipped: 0, failed: 5
    Some of the values were corrupted - 83.3 percent.

    The JTAG IR Integrity scan-test has failed.

    -----[Perform the Integrity scan-test on the JTAG DR]------------------------

    This test will use blocks of 512 32-bit words.
    This test will be applied just once.

    Do a test using 0xFFFFFFFF.
    Test 1 Word 0: scanned out 0xFFFFFFFF and scanned in 0x00000000.
    Test 1 Word 1: scanned out 0xFFFFFFFF and scanned in 0x00000000.
    Test 1 Word 2: scanned out 0xFFFFFFFF and scanned in 0x00000000.
    Test 1 Word 3: scanned out 0xFFFFFFFF and scanned in 0x00000000.
    Test 1 Word 4: scanned out 0xFFFFFFFF and scanned in 0x00000000.
    Test 1 Word 5: scanned out 0xFFFFFFFF and scanned in 0x00000000.
    Test 1 Word 6: scanned out 0xFFFFFFFF and scanned in 0x00000000.
    Test 1 Word 7: scanned out 0xFFFFFFFF and scanned in 0x00000000.
    The details of the first 8 errors have been provided.
    The utility will now report only the count of failed tests.
    Scan tests: 1, skipped: 0, failed: 1
    Do a test using 0x00000000.
    Scan tests: 2, skipped: 0, failed: 1
    Do a test using 0xFE03E0E2.
    Scan tests: 3, skipped: 0, failed: 2
    Do a test using 0x01FC1F1D.
    Scan tests: 4, skipped: 0, failed: 3
    Do a test using 0x5533CCAA.
    Scan tests: 5, skipped: 0, failed: 4
    Do a test using 0xAACC3355.
    Scan tests: 6, skipped: 0, failed: 5
    Some of the values were corrupted - 83.3 percent.

    The JTAG DR Integrity scan-test has failed.

    [End: Texas Instruments XDS100v1 USB Emulator_0]

    Also when i chose emulator v2 this error appeared:

    [Start: Texas Instruments XDS100v2 USB Emulator_0]

    Execute the command:

    %ccs_base%/common/uscif/dbgjtag -f %boarddatafile% -rv -o -F inform,logfile=yes -S pathlength -S integrity

    [Result]


    -----[Print the board config pathname(s)]------------------------------------

    C:\Users\eg\AppData\Local\TEXASI~1\CCS\ti\
    1\0\BrdDat\testBoard.dat

    -----[Print the reset-command software log-file]-----------------------------

    This utility has selected a 100- or 510-class product.
    This utility will load the adapter 'jioserdesusb.dll'.
    The library build date was 'May 21 2014'.
    The library build time was '17:19:59'.
    The library package version is '5.1.507.0'.
    The library component version is '35.34.40.0'.
    The controller does not use a programmable FPGA.
    The controller has a version number of '4' (0x00000004).
    The controller has an insertion length of '0' (0x00000000).
    This utility will attempt to reset the controller.
    This utility has successfully reset the controller.

    -----[Print the reset-command hardware log-file]-----------------------------

    The scan-path will be reset by toggling the JTAG TRST signal.
    The controller is the FTDI FT2232 with USB interface.
    The link from controller to target is direct (without cable).
    The software is configured for FTDI FT2232 features.
    The controller cannot monitor the value on the EMU[0] pin.
    The controller cannot monitor the value on the EMU[1] pin.
    The controller cannot control the timing on output pins.
    The controller cannot control the timing on input pins.
    The scan-path link-delay has been set to exactly '0' (0x0000).

    -----[The log-file for the JTAG TCLK output generated from the PLL]----------

    There is no hardware for programming the JTAG TCLK frequency.

    -----[Measure the source and frequency of the final JTAG TCLKR input]--------

    There is no hardware for measuring the JTAG TCLK frequency.

    -----[Perform the standard path-length test on the JTAG IR and DR]-----------

    This path-length test uses blocks of 512 32-bit words.

    The test for the JTAG IR instruction path-length failed.
    The JTAG IR instruction scan-path is stuck-at-zero.

    The test for the JTAG DR bypass path-length failed.
    The JTAG DR bypass scan-path is stuck-at-zero.

    -----[Perform the Integrity scan-test on the JTAG IR]------------------------

    This test will use blocks of 512 32-bit words.
    This test will be applied just once.

    Do a test using 0xFFFFFFFF.
    Test 1 Word 0: scanned out 0xFFFFFFFF and scanned in 0x00000000.
    Test 1 Word 1: scanned out 0xFFFFFFFF and scanned in 0x00000000.
    Test 1 Word 2: scanned out 0xFFFFFFFF and scanned in 0x00000000.
    Test 1 Word 3: scanned out 0xFFFFFFFF and scanned in 0x00000000.
    Test 1 Word 4: scanned out 0xFFFFFFFF and scanned in 0x00000000.
    Test 1 Word 5: scanned out 0xFFFFFFFF and scanned in 0x00000000.
    Test 1 Word 6: scanned out 0xFFFFFFFF and scanned in 0x00000000.
    Test 1 Word 7: scanned out 0xFFFFFFFF and scanned in 0x00000000.
    The details of the first 8 errors have been provided.
    The utility will now report only the count of failed tests.
    Scan tests: 1, skipped: 0, failed: 1
    Do a test using 0x00000000.
    Scan tests: 2, skipped: 0, failed: 1
    Do a test using 0xFE03E0E2.
    Scan tests: 3, skipped: 0, failed: 2
    Do a test using 0x01FC1F1D.
    Scan tests: 4, skipped: 0, failed: 3
    Do a test using 0x5533CCAA.
    Scan tests: 5, skipped: 0, failed: 4
    Do a test using 0xAACC3355.
    Scan tests: 6, skipped: 0, failed: 5
    Some of the values were corrupted - 83.3 percent.

    The JTAG IR Integrity scan-test has failed.

    -----[Perform the Integrity scan-test on the JTAG DR]------------------------

    This test will use blocks of 512 32-bit words.
    This test will be applied just once.

    Do a test using 0xFFFFFFFF.
    Test 1 Word 0: scanned out 0xFFFFFFFF and scanned in 0x00000000.
    Test 1 Word 1: scanned out 0xFFFFFFFF and scanned in 0x00000000.
    Test 1 Word 2: scanned out 0xFFFFFFFF and scanned in 0x00000000.
    Test 1 Word 3: scanned out 0xFFFFFFFF and scanned in 0x00000000.
    Test 1 Word 4: scanned out 0xFFFFFFFF and scanned in 0x00000000.
    Test 1 Word 5: scanned out 0xFFFFFFFF and scanned in 0x00000000.
    Test 1 Word 6: scanned out 0xFFFFFFFF and scanned in 0x00000000.
    Test 1 Word 7: scanned out 0xFFFFFFFF and scanned in 0x00000000.
    The details of the first 8 errors have been provided.
    The utility will now report only the count of failed tests.
    Scan tests: 1, skipped: 0, failed: 1
    Do a test using 0x00000000.
    Scan tests: 2, skipped: 0, failed: 1
    Do a test using 0xFE03E0E2.
    Scan tests: 3, skipped: 0, failed: 2
    Do a test using 0x01FC1F1D.
    Scan tests: 4, skipped: 0, failed: 3
    Do a test using 0x5533CCAA.
    Scan tests: 5, skipped: 0, failed: 4
    Do a test using 0xAACC3355.
    Scan tests: 6, skipped: 0, failed: 5
    Some of the values were corrupted - 83.3 percent.

    The JTAG DR Integrity scan-test has failed.

    [End: Texas Instruments XDS100v2 USB Emulator_0]

    What is the problem now??

    Thanks

  • 0 in reply to shady mamdouh
    TI__Guru 57255 points

    Hi,

    Is this behavior different from when you had the switch configured as Up,Up,Up,Up?


    Thank you,
    Brett

  • 0 in reply to shady mamdouh
    TI__Guru 57255 points

    Then I suspect your controlCARD has been damaged.  I would recommend purchasing a new one.
    (this is based on your responses to my questions and the fact that your Docking Station's emulator works on your friend's controlCARD)

    ESD damage or driving IO pins with greater than 3.3V are common mistakes.


    Thank you,
    Brett

  • 0 in reply to Brett Larimore
    Intellectual 575 points
    But I didn't connect any thing to the board i just purchased it 2 weeks ago spending all that time trying to connect it with CCS
    Can the control card is defected from the company? or can I replace it with another one?
    Thanks
  • 0 in reply to shady mamdouh
    TI__Guru 57255 points

    All controlCARDs are tested prior to being shipped out.  That being said, perhaps yours was damaged in shipping. 

    Since (1) you purchased your kit recently, (2) there is a decent likelihood in my mind that you haven't damaged it yourself, and (3) the above discussion:


    Thank you,
    Brett