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Tool/software: Code Composer Studio
I have a connection problem.
I am using docking station named on the board as, "Docking-Stn USB-EMU [R3]" with the control card of 28035 Piccolo family named on the board as "CC2803x ISo DIMM REV 1.3". From the code composer studio in Traget configuration settings I am selecting connection as " Texas Instrument XDS100v1 USB Debug Probe" and Board or device as " Experimenter's Kit - Piccolo F28035".
But after saving and doing test connection the following results generate which shows JTAG has failed the Integrity scan-test. I have 2 control cards on both it is showing the same error.
the complete error is as follow:
[Start: Texas Instruments XDS100v1 USB Debug Probe_0]
Execute the command:
%ccs_base%/common/uscif/dbgjtag -f %boarddatafile% -rv -o -F inform,logfile=yes -S pathlength -S integrity
[Result]
-----[Print the board config pathname(s)]------------------------------------
C:\Users\ahmad\AppData\Local\TEXASI~1\CCS\
ti\3\0\BrdDat\testBoard.dat
-----[Print the reset-command software log-file]-----------------------------
This utility has selected a 100- or 510-class product.
This utility will load the adapter 'jioserdesusb.dll'.
The library build date was 'Jul 21 2017'.
The library build time was '19:36:41'.
The library package version is '7.0.48.0'.
The library component version is '35.35.0.0'.
The controller does not use a programmable FPGA.
The controller has a version number of '4' (0x00000004).
The controller has an insertion length of '0' (0x00000000).
This utility will attempt to reset the controller.
This utility has successfully reset the controller.
-----[Print the reset-command hardware log-file]-----------------------------
The scan-path will be reset by toggling the JTAG TRST signal.
The controller is the FTDI FT2232 with USB interface.
The link from controller to target is direct (without cable).
The software is configured for FTDI FT2232 features.
The controller cannot monitor the value on the EMU[0] pin.
The controller cannot monitor the value on the EMU[1] pin.
The controller cannot control the timing on output pins.
The controller cannot control the timing on input pins.
The scan-path link-delay has been set to exactly '0' (0x0000).
-----[The log-file for the JTAG TCLK output generated from the PLL]----------
There is no hardware for programming the JTAG TCLK frequency.
-----[Measure the source and frequency of the final JTAG TCLKR input]--------
There is no hardware for measuring the JTAG TCLK frequency.
-----[Perform the standard path-length test on the JTAG IR and DR]-----------
This path-length test uses blocks of 64 32-bit words.
The test for the JTAG IR instruction path-length failed.
The JTAG IR instruction scan-path is stuck-at-ones.
The test for the JTAG DR bypass path-length failed.
The JTAG DR bypass scan-path is stuck-at-ones.
-----[Perform the Integrity scan-test on the JTAG IR]------------------------
This test will use blocks of 64 32-bit words.
This test will be applied just once.
Do a test using 0xFFFFFFFF.
Scan tests: 1, skipped: 0, failed: 0
Do a test using 0x00000000.
Test 2 Word 0: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 1: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 2: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 3: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 4: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 5: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 6: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 7: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
The details of the first 8 errors have been provided.
The utility will now report only the count of failed tests.
Scan tests: 2, skipped: 0, failed: 1
Do a test using 0xFE03E0E2.
Scan tests: 3, skipped: 0, failed: 2
Do a test using 0x01FC1F1D.
Scan tests: 4, skipped: 0, failed: 3
Do a test using 0x5533CCAA.
Scan tests: 5, skipped: 0, failed: 4
Do a test using 0xAACC3355.
Scan tests: 6, skipped: 0, failed: 5
Some of the values were corrupted - 83.3 percent.
The JTAG IR Integrity scan-test has failed.
-----[Perform the Integrity scan-test on the JTAG DR]------------------------
This test will use blocks of 64 32-bit words.
This test will be applied just once.
Do a test using 0xFFFFFFFF.
Scan tests: 1, skipped: 0, failed: 0
Do a test using 0x00000000.
Test 2 Word 0: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 1: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 2: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 3: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 4: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 5: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 6: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 7: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
The details of the first 8 errors have been provided.
The utility will now report only the count of failed tests.
Scan tests: 2, skipped: 0, failed: 1
Do a test using 0xFE03E0E2.
Scan tests: 3, skipped: 0, failed: 2
Do a test using 0x01FC1F1D.
Scan tests: 4, skipped: 0, failed: 3
Do a test using 0x5533CCAA.
Scan tests: 5, skipped: 0, failed: 4
Do a test using 0xAACC3355.
Scan tests: 6, skipped: 0, failed: 5
Some of the values were corrupted - 83.3 percent.
The JTAG DR Integrity scan-test has failed.
[End: Texas Instruments XDS100v1 USB Debug Probe_0]
Hello Mathew,
Yes the both LEDs are turned green LD1 and LD4. But still I tried with both controllers and when SW3 is in down position only LD1 and LED4 are on. when SW3 is moved to other position LD3 starts to blink red and it keeps on blinking red even the SW3 is moved to down position. Is it normal? and not in any way CCS is show the same test connectivity result. below I have attached the screenshot from Device manager it is showing that two XDS 100 ports of TI is connected.
Can you suggest any other approach?
Regards,
Mohsin Ejaz Ahmad
Hello Matthew,
Below I have attached the image as you the positions of the switches you can have a look. I turned it on like step-by-step as:
1- Set up the positions of switches.
2- connection with mini usb to computer to power controlCARD.
3- docking station Usb connection with PC.
4- from Target configurations: Connection: Texas Instrument XDS100v1 USB Debug Probe
5- Board or Device Experimenter's Kit - Piccolo F28035 (I changed to TMS320F28035)
with these settings too and this configuration the error is there and it is not building the project. I am sure that there is some problem in setting up because I am working with Piccolo ControlSTICK F28027 in parallel but i have to use docking station and control card because of more GPIO pins.
