Hi expert,
My customer made new board with F28374S and have problem with JTAG connection. Though I think the schematic have no issue, but I still need your help to have a look at it. (two board of two have the same issue)
The error message shows:
Error connecting to the target:
(Error -2131 @ 0x0)
Unable to access device register. Reset the device, and retry the operation. If
error persists, confirm configuration, power-cycle the board, and/or try
more reliable JTAG settings (e.g. lower TCLK).
The debugger log file shows:
[Start: Texas Instruments XDS110 USB Debug Probe_0]
Execute the command:
%ccs_base%/common/uscif/dbgjtag -f %boarddatafile% -rv -o -S integrity
[Result]
-----[Print the board config pathname(s)]------------------------------------
C:\Users\KAILIA~1.ZHA\AppData\Local\TEXASI~1\
CCS\ti\0\0\BrdDat\testBoard.dat
-----[Print the reset-command software log-file]-----------------------------
This utility has selected a 100- or 510-class product.
This utility will load the adapter 'jioxds110.dll'.
The library build date was 'Apr 30 2019'.
The library build time was '14:17:18'.
The library package version is '8.1.0.00012'.
The library component version is '35.35.0.0'.
The controller does not use a programmable FPGA.
The controller has a version number of '5' (0x00000005).
The controller has an insertion length of '0' (0x00000000).
This utility will attempt to reset the controller.
This utility has successfully reset the controller.
-----[Print the reset-command hardware log-file]-----------------------------
The scan-path will be reset by toggling the JTAG TRST signal.
The controller is the XDS110 with USB interface.
The link from controller to target is direct (without cable).
The software is configured for XDS110 features.
The controller cannot monitor the value on the EMU[0] pin.
The controller cannot monitor the value on the EMU[1] pin.
The controller cannot control the timing on output pins.
The controller cannot control the timing on input pins.
The scan-path link-delay has been set to exactly '0' (0x0000).
-----[Perform the Integrity scan-test on the JTAG IR]------------------------
This test will use blocks of 64 32-bit words.
This test will be applied just once.
Do a test using 0xFFFFFFFF.
Scan tests: 1, skipped: 0, failed: 0
Do a test using 0x00000000.
Scan tests: 2, skipped: 0, failed: 0
Do a test using 0xFE03E0E2.
Test 3 Word 0: scanned out 0xFE03E0E2 and scanned in 0xFFFFFFFF.
Test 3 Word 1: scanned out 0xFE03E0E2 and scanned in 0xFFFFFFFF.
Test 3 Word 2: scanned out 0xFE03E0E2 and scanned in 0xFFFFFFFF.
Test 3 Word 3: scanned out 0xFE03E0E2 and scanned in 0xFFFFFFFF.
Test 3 Word 4: scanned out 0xFE03E0E2 and scanned in 0xFFFFFFFF.
Test 3 Word 5: scanned out 0xFE03E0E2 and scanned in 0xFFFFFFFF.
Test 3 Word 6: scanned out 0xFE03E0E2 and scanned in 0xFFFFFFFF.
Test 3 Word 7: scanned out 0xFE03E0E2 and scanned in 0xFFFFFFFF.
The details of the first 8 errors have been provided.
The utility will now report only the count of failed tests.
Scan tests: 3, skipped: 0, failed: 1
Do a test using 0x01FC1F1D.
Scan tests: 4, skipped: 0, failed: 2
Do a test using 0x5533CCAA.
Scan tests: 5, skipped: 0, failed: 3
Do a test using 0xAACC3355.
Scan tests: 6, skipped: 0, failed: 4
Some of the values were corrupted - 65.6 percent.
The JTAG IR Integrity scan-test has failed.
-----[Perform the Integrity scan-test on the JTAG DR]------------------------
This test will use blocks of 64 32-bit words.
This test will be applied just once.
Do a test using 0xFFFFFFFF.
Scan tests: 1, skipped: 0, failed: 0
Do a test using 0x00000000.
Scan tests: 2, skipped: 0, failed: 0
Do a test using 0xFE03E0E2.
Test 3 Word 0: scanned out 0xFE03E0E2 and scanned in 0xFFFFFFF9.
Test 3 Word 1: scanned out 0xFE03E0E2 and scanned in 0xFFFFFFFF.
Test 3 Word 2: scanned out 0xFE03E0E2 and scanned in 0xFFFFFFFF.
Test 3 Word 3: scanned out 0xFE03E0E2 and scanned in 0xFFFFFFFF.
Test 3 Word 4: scanned out 0xFE03E0E2 and scanned in 0xFFFFFFFF.
Test 3 Word 5: scanned out 0xFE03E0E2 and scanned in 0xFFFFFFFF.
Test 3 Word 6: scanned out 0xFE03E0E2 and scanned in 0xFFFFFFFF.
Test 3 Word 7: scanned out 0xFE03E0E2 and scanned in 0xFFFFFFFF.
The details of the first 8 errors have been provided.
The utility will now report only the count of failed tests.
Scan tests: 3, skipped: 0, failed: 1
Do a test using 0x01FC1F1D.
Scan tests: 4, skipped: 0, failed: 2
Do a test using 0x5533CCAA.
Scan tests: 5, skipped: 0, failed: 3
Do a test using 0xAACC3355.
Scan tests: 6, skipped: 0, failed: 4
Some of the values were corrupted - 65.6 percent.
The JTAG DR Integrity scan-test has failed.
[End: Texas Instruments XDS110 USB Debug Probe_0]
The schematic they have shown below:
Thanks
Sheldon
