We now use 3000 chips and have 10 defective products. Now we request to send you the defective products to help us analyze the causes.
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We now use 3000 chips and have 10 defective products. Now we request to send you the defective products to help us analyze the causes.
Hi Shanzhong,
if you want to do the FA process , maybe you need to contact with sales team , and let them help you with FA process.
Dear,
Products were purchased online from the TI store, Fault analysis I need to contact Which department? I can't find the link of fault analysis on Ti website. I need help,Thanks.
Hi Shanzhong,
you can do the ABBA swap (put the fail chip at good board and put the good chip at fail board ) to make sure the fail behavior caused by the fail chip.
We also need your help to share more background about the fail behavior.
Hi
if the issue is following with IC , maybe you can get local disty or TI sales team help for the FA process.
Comments from TI: TI has reviewed this request and determined that the problem description is not clear. Please update the problem description based on TI device functionality. Tell failure pins and corresponding failure signals/waveforms, comparing btw NG and GOOD. Also, please contact TI techncial engineer to review the application design.
My request for fault analysis was rejected. I don't quite understand what information , I need to add. Can you explain it to me?
Comments from TI: TI has reviewed this request and determined that the problem description is not clear. Please update the problem description based on TI device functionality. Tell failure pins and corresponding failure signals/waveforms, comparing btw NG and GOOD. Also, please contact TI techncial engineer to review the application design.
The submission of fault analysis was rejected. Please let me know the detailed reasons. We will re-submit based on your instructions.
Hi Shanzhong,
you need to add more information about its failure behavior , so you need to provide the failure pin waveform at fail condition , and you need to also use good IC the waveform with same test condition.