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BQ28Z610-R1: BQ28Z610-R1 MOS burn issue

Star Xu
Genius 9645 points
Part Number: BQ28Z610-R1

Hi 

The customer design with BQ28Z610-R1, when do the short test the MOS was burn.

1. Cell capacity 11000mAh, total voltage 8.9V

2. MOS model: AOC3870C * 4

Please help check the schematic.

Thanks

Star

  • 0
    TI__Mastermind 23091 points

    Hello Star,

    There could be many causes of electronics failures, but for a short circuit in a battery the following are some possible causes to consider and test:

    1. The FETs are not commanded off and are damaged
    2. The FETs turn off too slowly and are damaged
    3. The FETs turn off too quickly and the inductive spike damages the FETs or the BMS circuitry
    4. Parallel FETs oscillate during turn off and are damaged.

    Please reference to this FAQ for SCD debugging. How to debug FET failure resulting from short-circuit testing

    I am inclined to say this behavior is due to bullet point number 4 above. The gate of each FET requires a small gate resistance to avoid oscillations. Please also reference to this app note - Tips for Successfully Paralleling Power MOSFETs

    Regards,
    Jose Couso