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LMG3422EVM-043: LMG3422EVM-043

Part Number: LMG3422EVM-043

I am trying to test the GaN daughter body (LMG3422EVM-043) as a synchronous buck. Around 350V input, If I increase the load current close to 10A, it tripes. (a fault on the upper MOSFET). Any help on what could be causing this is appreciated. 

  • Hi Ronald,

    Can you share more details about your setup for the buck converter, what are you connecting the GaN daughter card to? How are you controlling the PWM input to the daughtercard and how are you reading the /Fault, /OC pins from the daughtercard?

    Best,
    Kyle Wolf

  • I am supplying the DC source 350V directly to the daughter board(PGND and HV). The midpoint pin of the daughter board (SW pin) is connected through an LC filter to a resistive load. The PWM signals are being supplied by a DSpace controller for the high side and low side MOSFETs(  HS_PWM and AGND and also LS_PWM and AGND). I am increasing the current by increasing the duty cycle of PWM signals, at some point around 9Amp output current, it is tripping(i.e  the midpoint SW voltage pulses  that I am reading on the oscilloscope stops displaying). Iam reading the fault on pins(HS_Fault and LS_fault which  are active low).

  • In addition, I am powering the daughter board with 5V from the DSpace controller, and a deatime of 100ns.

  • Hi Ronald,

    This sounds like the GaN FETs are registering a /Fault condition. Are you also monitoring the /OC pin in this test?