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CSD19533Q5A: CSD Family Die Differences for Radiation Testing

Part Number: CSD19533Q5A
Other Parts Discussed in Thread: CSD19538Q2, CSD

Hello,

We are looking to understand the similarities between the CSD19532Q5BT and CSD19538Q2 MOSFETs in comparison to CSD19533Q5AT. We have previously done radiation testing on the CSD19533Q5ATpart and would like to qualify the other two MOSFETs by similarity. Are the CSD family of MOSFETs similar enough that radiation testing on these parts can be qualified by similarity? 

We don’t need to know any proprietary information, only looking to find out if the different parts are similar enough that we can forgo the testing for the parts in question.

Thank you for your help!

  • Hello Kyle,

    Thanks for your interest in TI FETs. There are package differences. The silicon die in those packages are different sizes and aspect ratios for the specified on resistance. They all follow the same design rules with the same gate structures (i.e. same process generation). TI has never performed any radiation testing on these FETs as they were designed for commercial applications and TI cannot guarantee any level of performance under radiation testing. I hope this helps. Please let me know if you have any questions.

    Best Regards,

    John Wallace

    TI FET Applications