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Original question:

BQ76200: fail to pass the short-circuit test

BQ76200: BQ76200 Damage to the MOS during short-circuit test

Derek Zhong
Intellectual 470 points
Part Number: BQ76200

Dear TI,

My key customer used BQ76200 to drive the MOSFET, but it caused damage to the MOS during short-circuit test, please review the sch and give us some advise, This is Derek from distributor Arrow Asia, could you contact me by mail, if need I will loop you in the e-mail of my customer. Thank you. Urgently.

  • 0
    TI__Guru* 79103 points

    Hi Derek,

    The value of C51 should be 0.01uF. The larger value in your schematic (0.1uF) will extend the turn off time and can cause FET damage. The filter capacitors on the cell inputs on the BQ769x0 should also be large enough (1uF is recommended).

    Best regards,

    Matt