* AM3354 based system, NAND booting (using PSP v04.06.00.11)
They are using Toshiba NAND, TC58NVG1S3.
Before, there was no such issue, but recently, booting issue happened with specific NAND devices. (There was no S/W H/W changes.)
The error rate is about 5%.
The symptom is when system booting, UBI file system runs "torture test" many times.
Booting failure also happened in some cases.
When doing NAND swap test, the issue happening follows the specific NAND device.
They are checking the difference between OK NAND and NG NAND device.
In the mean time, can you give any idea about "UBI: run torture test for PEB" log message happening with Toshiba NAND booting?
I referred below E2E post, it is locked with no answer.
* https://e2e.ti.com/support/embedded/linux/f/354/t/564718
So, if you have any idea, please let me know.
Thanks and regards,
Hayden
