CCS/TMS320DM8127: How to write code for DM8127, need a step by step tutorial.

I've tried to create a CCS project, however, when I choose connection that XDS100v2 or v3 and Verify. I got this error

[Start]

Execute the command:

%ccs_base%/common/uscif/dbgjtag -f %boarddatafile% -rv -o -F inform,logfile=yes -S pathlength -S integrity

[Result]


-----[Print the board config pathname(s)]------------------------------------

/home/sang/.ti/ti/1/0/BrdDat/testBoard.dat

-----[Print the reset-command software log-file]-----------------------------

This utility has selected a 100- or 510-class product.
This utility will load the adapter 'libjioserdesusbv3.so'.

An error occurred while soft opening the controller.

-----[An error has occurred and this utility has aborted]--------------------

This error is generated by TI's USCIF driver or utilities.

The value is '-151' (0xffffff69).
The title is 'SC_ERR_FTDI_OPEN'.

The explanation is:
One of the FTDI driver functions used during the connect
returned bad status or an error. The cause may be one or
more of: no XDS100 is plugged in, invalid XDS100 serial number,
blank XDS100 EEPROM, missing FTDI drivers, faulty USB cable.
Use the xds100serial command-line utility in the 'common/uscif'
folder to verify the XDS100 can be located.

[End]

Sang,

Do yo use TMDSCSK8127 Evaluation Module?

DM8127 camera starter kit (CSK) contents:
• TMDSCSK8127 module
• CSK carrier card
• Camera module (LI-CAM-AR0331-324-1.8) with FPC cable

DM8127 CSK comes with XDS100v2 on board emulator, located at CSK carrier card. You need to connect USB cable to Micro USB connector J11.

Regards,
Pavel

Yes, I use TMDCSK8127 Evaluation Module with full options as you list above.

I have rewrite the sdCard, following: processors.wiki.ti.com/.../IPNC_RDK_DM38x_,_DM8127

Is this effects any thing to the connection ?
Thanks,

Sang,

No, SD card can not impact JTAG connection. You should be able to connect your DM8127 board to JTAG with and without SD card.

Check if you have below emulation package installed.

www.ti.com/.../spruid6.pdf - 4.1 XDS Driver Installation

Regards,
Pavel

I already installed XSD Driver, but the problem wasn't solved.

Sang,

Refer to the below pointers:

software-dl.ti.com/.../ccsv7_debugging_jtag_connectivity_issues.html

e2e.ti.com/.../191334
e2e.ti.com/.../214151
e2e.ti.com/.../234074

e2e.ti.com/.../286087
e2e.ti.com/.../248800
e2e.ti.com/.../2660872
e2e.ti.com/.../708800

Regards,
Pavel

I get out of stucking in :
The value is '-151' (0xffffff69).
The title is 'SC_ERR_FTDI_OPEN'.

problem.

But I am heading to the other:

The scan-path will be reset by toggling the JTAG TRST signal.
The controller is the FTDI FT2232 with USB interface.
The link from controller to target is direct (without cable).
The software is configured for FTDI FT2232 features.
The controller cannot monitor the value on the EMU[0] pin.
The controller cannot monitor the value on the EMU[1] pin.
The controller cannot control the timing on output pins.
The controller cannot control the timing on input pins.
The scan-path link-delay has been set to exactly '0' (0x0000).

-----[The log-file for the JTAG TCLK output generated from the PLL]----------

There is no hardware for programming the JTAG TCLK frequency.

-----[Measure the source and frequency of the final JTAG TCLKR input]--------

There is no hardware for measuring the JTAG TCLK frequency.

-----[Perform the standard path-length test on the JTAG IR and DR]-----------

This path-length test uses blocks of 64 32-bit words.

The test for the JTAG IR instruction path-length failed.
The JTAG IR instruction scan-path is stuck-at-ones.

The test for the JTAG DR bypass path-length failed.
The JTAG DR bypass scan-path is stuck-at-ones.

-----[Perform the Integrity scan-test on the JTAG IR]------------------------

This test will use blocks of 64 32-bit words.
This test will be applied just once.

Do a test using 0xFFFFFFFF.
Scan tests: 1, skipped: 0, failed: 0
Do a test using 0x00000000.
Test 2 Word 0: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 1: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 2: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 3: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 4: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 5: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 6: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 7: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
The details of the first 8 errors have been provided.
The utility will now report only the count of failed tests.
Scan tests: 2, skipped: 0, failed: 1
Do a test using 0xFE03E0E2.
Scan tests: 3, skipped: 0, failed: 2
Do a test using 0x01FC1F1D.
Scan tests: 4, skipped: 0, failed: 3
Do a test using 0x5533CCAA.
Scan tests: 5, skipped: 0, failed: 4
Do a test using 0xAACC3355.
Scan tests: 6, skipped: 0, failed: 5
Some of the values were corrupted - 83.3 percent.

The JTAG IR Integrity scan-test has failed.

-----[Perform the Integrity scan-test on the JTAG DR]------------------------

This test will use blocks of 64 32-bit words.
This test will be applied just once.

Do a test using 0xFFFFFFFF.
Scan tests: 1, skipped: 0, failed: 0
Do a test using 0x00000000.
Test 2 Word 0: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 1: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 2: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 3: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 4: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 5: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 6: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 7: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
The details of the first 8 errors have been provided.
The utility will now report only the count of failed tests.
Scan tests: 2, skipped: 0, failed: 1
Do a test using 0xFE03E0E2.
Scan tests: 3, skipped: 0, failed: 2
Do a test using 0x01FC1F1D.
Scan tests: 4, skipped: 0, failed: 3
Do a test using 0x5533CCAA.
Scan tests: 5, skipped: 0, failed: 4
Do a test using 0xAACC3355.
Scan tests: 6, skipped: 0, failed: 5
Some of the values were corrupted - 83.3 percent.

The JTAG DR Integrity scan-test has failed.

[End]

Sang,

sang nguyen25 said:

But I am heading to the other:

The scan-path will be reset by toggling the JTAG TRST signal.
The controller is the FTDI FT2232 with USB interface.
The link from controller to target is direct (without cable).
The software is configured for FTDI FT2232 features.
The controller cannot monitor the value on the EMU[0] pin.
The controller cannot monitor the value on the EMU[1] pin.
The controller cannot control the timing on output pins.
The controller cannot control the timing on input pins.
The scan-path link-delay has been set to exactly '0' (0x0000).

You should ask/post this type of questions (relate to JTAG, Emulation) in CCStudio forum:

See for example below CCS e2e thread:

Regards,
Pavel