Other Parts Discussed in Thread: TMCS1123
Hello Sir,
We have implemented the TMCS1107A1Q in our recently designed product. I've come to understand that there are inherent offsets in the ICs that need to be eliminated for precise current measurements.
To our surprise, we've observed differing offset values and nonlinearity trends when analyzing data from various ICs. This situation is puzzling since we procured all these ICs together, anticipating they originated from the same batch. Our initial assumption was that ICs from the same batch would exhibit consistent offset values and nonlinearity characteristics. However, our findings indicate the need for individual calibration of each device before integrating them into the actual boards for delivery. In our particular case, we employ four ITMCS1107 ICs on a single board, and all of them necessitate individual calibration. This presents a notable challenge, especially in light of our ambitions for high-volume production. If the data patterns align as expected for ICs from the same batch, we could potentially employ a calibration process on one IC and transfer this to the others (e.g., through firmware coding in the MCU) from the same batch. This approach would lessen the workload on our engineers and reduce production time.
I would highly appreciate any suggestions you may offer to resolve this issue.
