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CCS/TMS320F28069: tmdscncd28069iso -- General Congfiguration and Connection

Part Number: TMS320F28069
Other Parts Discussed in Thread: TMDSCNCD28069ISO

Tool/software: Code Composer Studio

Hello Folks,

I bought TMDSCNCD28069ISO Dev Board for piccolo. I am pretty new to CCS. I have started playing with this dev board. I have used USB cable to establish the connection between the computer and dev kit. While I am trying to debug the code, I got an error like

C28xx: Error connecting to the target: (Error -1135 @ 0x0) The debug probe reported an error. Confirm debug probe configuration and connections, reset the debug probe, and retry the operation. (Emulation package 6.0.504.4).

 What is the general setup configuration and connections  for the target  tmdscncd28069iso. How can I flash the dev kit. Where can I get some sample example to play with this development board.

Thanks in advance,


Regards,

Ranjit

  • Hi Ranjit,
    Check the documentation to make sure the switches are correct for the card. I believe SW3 can toggle between using the onboard XDS100v1 debug probe vs an external emulator. You want to use the former. I think they both need to be set to the ON position but I am not sure since I don't have one myself to check. It is best to refer to the documentation.

    Thanks
    ki
  • Hello

    I went through the documentation and set both switches (SW3) to be ON.  I have connected USB to J1 on the controlCARD - powers the emulator - LD4 on the controlCARD is turned on when plugged in. And I set the connection to XDS100V2 and device to F28069 on  target configuration. But I still getting the same error while I am trying to debug the code.

    Error connecting to the target:
    (Error -1135 @ 0x0)
    The debug probe reported an error. Confirm debug probe configuration and connections, reset the debug probe, and retry the operation.
    (Emulation package 6.0.504.4)


    And Also I tested connection on target configuration window and it failed.  

    This test will use blocks of 64 32-bit words.
    This test will be applied just once.

    Do a test using 0xFFFFFFFF.
    Scan tests: 1, skipped: 0, failed: 0
    Do a test using 0x00000000.
    Test 2 Word 0: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 1: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 2: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 3: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 4: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 5: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 6: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 7: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    The details of the first 8 errors have been provided.
    The utility will now report only the count of failed tests.
    Scan tests: 2, skipped: 0, failed: 1
    Do a test using 0xFE03E0E2.
    Scan tests: 3, skipped: 0, failed: 2
    Do a test using 0x01FC1F1D.
    Scan tests: 4, skipped: 0, failed: 3
    Do a test using 0x5533CCAA.
    Scan tests: 5, skipped: 0, failed: 4
    Do a test using 0xAACC3355.
    Scan tests: 6, skipped: 0, failed: 5
    Some of the values were corrupted - 83.3 percent.

    The JTAG DR Integrity scan-test has failed.

    [End: Texas Instruments XDS100v2 USB Debug Probe_0]

     


    Can anyone help me out with this issue.

    Regards,

    Ranjit