Other Parts Discussed in Thread: SYSCONFIG, , CC2642R
Tool/software:
We initially tested the CC2340R22(use sdk 8.10) for random number generation using the function int_fast16_t RNG_getRandomBits(RNG_Handle handle, void *randomBits, size_t randomBitsLength)
to retrieve random numbers, and found the quality to be lower than expected. After conducting the test four times with resets in between, we collected four sets of data, which showed deviations ranging from 20-30%.
Subsequently, we revised the relevant configuration files by replacing the current lrf_rfe_binary_ble5_cc23x0r5.c and rcl_settings_adc_noise.c files with those from the version 7.40 SDK. The results we obtained afterward indicated a marked improvement, yet there remains a considerable discrepancy.
This leads us to inquire about the following points:
- Does our test outcome suggest that the RNG component in the latest SDK(8.10) and chip versions is not as efficient as desired?
- What methods do you employ to verify the functionality of the RNG, and could we possibly refer to these methods for our own testing procedures?"