Hello,
I am using the SN74LVC1G17MDCK part in my design. I am doing some hot spot analysis under single failure conditions.
The failure assumed here is the latch up failure of this gate. This gate is powered by 3.3V rail capable of sourcing 3A.
My question is, Can the latch up failure result in a partial short across the supply terminal of this gate and draw enough current to be a hot spot in excess of 200degC and not pull down the rail i.e. it remains latent if the gate output is stuck in the expected state?
Regards, Infant Jesuraj