Part Number: SN54SC2T74-SEP Tool/software: Hi Team,
we typically do SEU testing for space grade devices.
for applications in aircrafts, is there an altitude threshold for when it makes sense to consider SEU events?
For example, can we say that SEU…
Part Number: SN54SC2T74-SEP
Tool/software:
Hi TI Team,
We have some questions regarding SN54SC2T74MPWTSEP.
Could you help me for the following questions? -
1. Are there any IBIS models and LT Spice models available? If so, could you share…
Part Number: SN54SC4T00-SEP Other Parts Discussed in Thread: SN54SC4T125-SEP , , SN54SC2T74-SEP Hi there,
I am looking into the radiation single event effects performance of the SN54SC4T00-SEP, and found the report: "SN54SC4T125-SEP Single-Event Latch…
Hi Walter,
We don't have radiation testing data on most of these devices. Our more recent devices ending in -SEP will have rad testing data, see here: SN54SC2T74-SEP data sheet, product information and support | TI.com . The BiCMOS part is still susceptible…
Part Number: SN74HCS74 Hello Team,
As shown on the subject, recently I am searching for D-type Flip-flop which is equipped with "initial-Q reset" or "initial-Q clear" feature, would like know from your side how can I lookup it quickly in the datasheet…
Hi Uriel,
Do you know the specific radiation needs?
For example, is radiation "tolerant" enough or does it need to have radiation "hardened"
If the device needs to be radiation hardened, we do not have many choices in this. Anything in our "AC"…
