Other Parts Discussed in Thread: ESD441
I have a window comparator design using TLV7042DDFR experiencing significant field failures where the resistance between INA- and VEE changes significantly.
On TLV7042 parts removed from returned PCBAs, I measure ~1.5k Ohms between INA- and VEE (both measurement polarities).
On unused, good TLV7042 parts, I measure ~360k Ohms from VEE to INA- and "OL" from INA- to VEE.
Does this change from at least 360k Ohms (good part) down to ~1.5k Ohms (damaged part) indicate evidence of any particular component stress condition (e.g. over-voltage condition, over-current condition, over-temperature condition)?
My implementation is essentially the same as documented in Figure 8-3. TLV704x-Based Window Comparator from the datasheet.