This thread has been locked.

If you have a related question, please click the "Ask a related question" button in the top right corner. The newly created question will be automatically linked to this question.

INA240: EOS/EIPD root cause - INA240A2QDRQ1

Part Number: INA240

Tool/software:

QEM-CCR-2403-00858 CPR241097474 / QEM-CCR-2403-00266 / QEM-CCR-2403-00241 /  QEM-CCR-2310-00688 / QEM-CCR-2310-00052 / QEM-CCR-2302-00871 / QEM-CCR-2302-00871 / 

QEM-CCR-2302-00765 / QEM-CCR-2210-00743 /  QEM-CCR-2210-00748 / QEM-CCR-2209-00551

We performed the required test on one of our good units and we did not observe any strange behavior- see attached picture with the signals (IC850 – startup_000.jpg), and also restarted several time manually to see if there is any change in behavior- but still we did not see anything (IC850 - repeated start up_000.jpg). 

IC850 - startup

IC850 - repeated start-up

We still can not explain the EOS and need your support

  • Hi,

    I reviewed some of the reports, it appears the failure mechanism has been well recognized by FA lab.

    Is there any pattern identified? For example, under what operating conditions do they get damaged, is it during power cycling or during normal operation? Are the parts bad at time zero, or do they fail after some time?

    Have you considered incorporating a ferrite bead on the supply pin to see if it helps lower the failure rate?

    Regards,

    Guang

  • Hi,

    All the cases are early failures (0 -2780 KM) at different customers. They passes all test at Hella: ICT, EOL and failed at customer. 

    We performed some test and did not observe any strange behavior. Any pattern identified yet. Under which conditions they got damaged are still unkwon

    Regards,

    Audrey

  • Hi Audrey,

    There is not much margin on the Vs supply spec (5.5V max) when considering process corners.

    I know pin voltages have been captured as shown in the scope shots, but the failures strongly hint at Vs over voltage. I suspect ferrite beads should be helpful to some degree.

    Regards,

    Guang