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LM124AQML-SP: Seeking additional SEE (Single Event Effects) radiation data - SEL/SEU (MeV/mg/cm^2) ratings

Mathew Dinh
Prodigy 35 points
Part Number: LM124AQML-SP
Other Parts Discussed in Thread: OPA4277-SP, LM124, SN55HVD233-SP

Tool/software:

Hello,

I am currently evaluating the LM124AQML-SP (5962R9950402VDA) for a space application that requires high reliability in a radiation-exposed environment. While the datasheet provides detailed information on the total ionizing dose (TID) tolerance, I could not locate specific data regarding the device’s susceptibility to Single-Event Effects (SEE), particularly Single-Event Latchup (SEL) and Single-Event Upset (SEU).

I would appreciate any additional information or education on the topic in either radiation characteristics or SEE immunity by design if appropriate.

Thank you!

  • 0
    TI__Guru* 77541 points

    Hi Mathew, 

    Could you see if the following links may meet your requirements?

    https://www.ti.com/lit/an/slvk047a/slvk047a.pdf?ts=1731896715491

    If you have additional questions, please let us know. 

    Best,

    Raymond

  • 0 in reply to Raymond Zhang1
    Prodigy 35 points

    Hi Raymond,

    I am more interested in the actual ratings of the device as it is not explicitly stated, instead of the methodology for test. For this specific device, it is mentioned in the additional information section that the SEL rating is equal to "Bipolar". I would like further definition on this or would like to see the SEE ratings if there are available SEE reports.

  • 0 in reply to Mathew Dinh
    TI__Guru* 77541 points

    Hi Mathew,

    Are you looking for The SEL conditions?

     

    The device is transferred from GPRAMP team, and I need to ask their engineer about the Latch-up test data. Please give me a few days to track it down. 

    Best,

    Raymond 

  • 0 in reply to Raymond Zhang1
    Prodigy 35 points

    Hi Raymond,

    Yes, I apologize for not being clear. That is what I am looking for this unit as well as 5962L1420901VXC (I already have another forum post uploaded but if can resolve both in just this one, I will resolve both).

    I am primarily interested in that concluding statement, "... OPA4277-SP is SEL-immune at LET = 85...". If data or verbiage exists for SEU as well then that would also be very helpful.

    To summarize, 

    Manufacturer PN

    Manufacturer

    Characteristic

    Value

    5962R9950402VDA

    Texas Instruments

    SEL (MeV/mg/cm^2)

    TBD

    SEU (MeV/mg/cm^2)

    TBD

    5962L1420901VXC

    SEU (MeV/mg/cm^2)

    TBD

    These are the characteristics I am seeking.

    Thank you for your support!

    Regards,

    Mat

  • 0 in reply to Mathew Dinh
    TI__Guru* 77541 points

    Hi Mathew, 

    These are space grade op amp from General Purpose Op Amps, which HVA team started to support last week. 

    https://www.ti.com/amplifier-circuit/op-amps/products.html#1498=Space&23typ=0.0055%3B50&

    Below is the list from the former Precision op amp (PRAMPS) product line, which is renamed to HVA (high voltage amplifier) team now. FYI, I believe that the OPA4277-SP is not available in stock currently. 

    https://www.ti.com/amplifier-circuit/op-amps/precision/products.html#1498=Military%3BSpace&sort=2192;asc&

    Anyway, I will post the SEL report and SEU information, if I can find the report.

    Best,

    Raymond 

  • 0 in reply to Raymond Zhang1
    TI__Guru* 77541 points

    Hi Mat, 

    I was told that we performed SET testing, but we did not observe SEL events. 

    LM124 is a pure junction isolated bipolar part.  SEL would be unexpected.  The LM124 has gone through heavy ion testing probably more than an other product by many different entities.  No one has ever reported SEL.

    Please let me know if you have other questions. 

    Best,

    Raymond

  • 0 in reply to Raymond Zhang1
    Prodigy 35 points

    Hi Raymond,

    Thank you very much for confirming that for LM124. Here are some of my follow up questions:

    1. Has there been any SEB/SEGR or SEFI testing for this part? If you can speak to low susceptibility due to design, that would be appreciated.

    2. Can you speak to SN55HVD233-SP as well in regard to SEU, SEB/SEGR, and SEFI? I have recorded a SEL value of 86 MeV/mg/cm^2 but would appreciate some verbiage or reports going over any of the other SEE.

    3. Are your general SEE reports available to view for both LM124 and SN55HVD233 from when rad testing was done in any capacity?

    I am aware that some of these SEE would be unexpected or low risk by design, but I am looking for that justification either in SEE reports or through the verbiage you have provided to me (thank you again!).

    Please let me know if you have any additional information on the questions above.

    Regards,

    Mat

  • +1 in reply to Mathew Dinh
    TI__Guru* 77541 points

    Hi Mat,

    Mathew Dinh said:
    . Has there been any SEB/SEGR or SEFI testing for this part?

    Single-Event Burnout (SEB) heavy-ion or neutron irradiation tests are typically performed on a device that is biased at high voltage. 32V op amp and 20mA source/sink current does not belong to the test category. 

    Single-Event Gate Rupture (SEGT) is a test for Mosfet devices. BJT does not have a gate oxide layer so this test is not applicable in my opinion. 

    Single-Event Functional Interrupt (SEFI) is used to evaluate functional behavior that does not apply to pure junction-isolated BJT devices. LM124 is a pure analog device and does not use digital logics internally.  

    Anyway, I will ask for these questions, and I will let you know, if any of above tests have been conducted. 

    Mathew Dinh said:
    2. Can you speak to SN55HVD233-SP as well in regard to SEU, SEB/SEGR, and SEFI?

    SN55HVD233-SP is supported by a different team. Our product lines are mainly op amp related devices. You have to submit a different query for the information. 

    Mathew Dinh said:
    3. Are your general SEE reports available to view for both LM124 and SN55HVD233 from when rad testing was done in any capacity?

    I will ask these information. Please give me a day or so. 

    Best,

    Raymond

  • 0 in reply to Raymond Zhang1
    Prodigy 35 points

    Hi Raymond,

    Thank you for confirming. I was looking for that specific verbiage and callout to confirm our current analysis, so I appreciate that.

    I think I am good to close on this topic - if any further data is accessible, please feel free to message me!

    Regards,

    Mat

  • 0 in reply to Mathew Dinh
    TI__Guru* 77541 points

    Hi Mat,

    FYI, here is a collection of SEL testing on bipolar products, which it may be helpful in your application. 

    SEL on various amps.pdf

    Best,

    Raymond

  • 0 in reply to Raymond Zhang1
    Prodigy 35 points

    Hi Ramond,

    Thank you for that - if there are any other SEE reports for the part, please let me know! 

    Regards,

    Mat

  • 0 in reply to Mathew Dinh
    TI__Guru* 77541 points

    Hi Mat, 

    Please create "friendship" request over E2E and I can send you some other data and presentation about the -SP product. 

    The E2E platform is public and the E2E private messaging platform is not shared with public forum. I am going to close this query for now, and I will wait for your reply. 

    Best,

    Raymond

  • 0 in reply to Raymond Zhang1
    Prodigy 35 points

    Hi Raymond,

    Submitted, thank you!

    -Mat