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OPA376: measurement circuit for quiescent current

Part Number: OPA376


Hello support team,

I'd like to know the measurement circuit for the quiescent current of OPA376.
According to the datasheet of OPA112, the following sentences are stated as conditions.
"At TA = 25°C, RL = 10 kΩ connected to VS / 2, VCM = VS / 2, and VOUT = VS / 2, unless otherwise noted."
From this, I guess the measurement circuit for quiescent current may be as follows.

Is my understanding correct?

And when under the following condition, I guess the circuit will be as follows.
"TA = 25°C, IO = 0, VS = 5.5 V, VCM < (V+ ) – 1.3 V"

In this circuit, I guess the circuit current at when the output is on the plus side rail voltage is measured.
Is my understanding correct?

Please correct them if there is a mistake.

Best regards,
M. Tachibana

  • Tachibana-san,

    You may NOT connect op amp in an open-loop configuration (no feedback) as shown on your circuit schematic because shorting the inputs will result in the internal input offset voltage being gained up by the open- loop gain thus forcing the output to one of the rails where datasheet condition of Vout=Vs/2 will NOT be satisfied.

    To measure IQ, place the op amp in buffer (follower) configuration, by shorting output to inverting (negative) input, while driving the non-inverting (positive) input to mid-supply.  The easiest way to accomplish this configuration is by using the dual +/-2.75V supplies and grounding the input.  You may then determine IQ by either placing an amp-meter or small (100ohm) resistor,  in series with positive or nagative supply pins and use amp-meter or volt-meter, respectively, to take the measurement. Since there should be no output current, Iout, under quiescent condition, there is no need to include RL in IQ measurement (it makes no difference).

  • Hello Lis-san,

    Thanks for your advice.

    According to your explanation, measurement circuit for quiescent current is as follows, isn't it?

    Are the specified values in the datasheet also measured with those circuit?

    And when I would like to measure the quiescent current under the following condition,
    should I apply Vs/2+1.3V (=3.75V) at V+ terminal in the left circuit?
    "TA = 25°C, IO = 0, VS = 5.5 V, VCM < (V+ ) – 1.3 V"
    Please let me confirm to be sure.

    Best regards,
    M. Tachibana

  • Tachibana-san,

    Your IQ measurement circuit configurations as shown above are correct and we measure IQ in production in a very similar way.  

    Having said that, as long as your input common-mode and the output voltage are within the OPA376 linear range (see CMRR and AOL condition column), the quiescent current will be the same.

  • Hello Lis-san,

    Thank you for your prompt reply.
    I understood about the measurement circuit and IQ within linear range.

    By the way, how much is the quiescent current in non-linear range such as near the both rail?
    Does it decrease or increase relative to IQ within linear range?

    Best regards,
    M. Tachibana
  • Tachibana-san,
    If the op amp operates in a non-linear range, the current you measure is NOT quiescent current anymore and it may vary differently in comparison to real IQ depending on the process technology and circuit topology used. Since we mostly characterize only linear op amp performance, we do not have such data to share with you but knowing that OPA376 is a CMOS part, I would expect the current to stay the same or go down.
  • Hello Lis-san,

    Thank you very much for your help.

    Since our customer pointed out that the current consumption tended to decrease less than IQ when measuring it near the rails, so I asked you questions.
    When the voltage of output signal is near the rail, I guess MOS transistors of internal circuits such as current mirror will operate in the non-saturation region. As a result, I think the current consumption would decrease.

    Is it correct?

    Best regards,
    M. Tachibana
  • Yes, that's correct. Slamming the output against the rail will force the output transistors to operate in the triode region, thus resulting in the decrease of the quiescent current in the output stage and therefore lower total IQ.