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CDCLVP111-SP: test

Part Number: CDCLVP111-SP

test

  • Sorry about the title ,  i was having issues submitting questions.

    Propagation delay of the DCDLVP111-SP

    the delay per degC is described here : CDCLVP111-SP: delay - Clock & timing forum - Clock & timing - TI E2E support forums

    There is a wide range between typical and max

    By how much does this vary over PVT? 

    IE if i calibrated a few parts for delay over temp, could i used that data in a production design, or do i need to calibrate every part?

    Once calibrated, how stable will the part be over a projected lifetime or 12 years in a LEO space environment? 

  • Hi Mark,

    There is a wide range between typical and max

    By how much does this vary over PVT? 

    This was tested over PVT, so the range you see reflects the variance over PVT. You could use the data from a few parts in a production design.

    Once calibrated, how stable will the part be over a projected lifetime or 12 years in a LEO space environment? 

    This does depend on the continuous junction temperature you are anticipating. Assuming 105degC, the device should be stable for around 40 years. See Figure 5-1 in the datasheet for more information.

    Thanks,

    Michael

  • Hi Michael

    is there any anticipated increase of the propagation as radiation exposure increases? 

  • Hi Mark,

    I'm going to have to run this question by our packaging team. I provided a tpd shift per degree Celsius in the above E2E, and I would think that would apply under the same circumstances of radiation - radiation would in theory increase the operating junction temperature of the device. My understanding of the physical material of the device is limited, so let me ask our experts. I will get back to you next week.

    Thanks,

    Michael

  • The objective is to  calibrate out the variations in propagation delay over temperature and time (any aging effects and radiation effects). The system tracks temperature and time.

    Do you have any test data on this, or advice on if that is feasible?

    As we can track temperature and time, and would test on each part (compensating for process variations).  How much variability form other factors would there be left? 

    We cannot track variation in the power rails. Will a small variation of the power (still in spec) be a significant contributor?

    We can irradiate devices to reflect increasing radiation exposure. Will that be a significant contributor? IE is it worth doing?

  • Hi Mark,

    Sorry for the delay. I have obtained the following:

    from 0-20 krad prop delay decreases while from 20-100 krad it increases

    This testing was done with LDR which gives incremental radiation at a  very low rate, this would simulate best customer use for GEO. These results are visible in the TID report for the CDCLVP111-SP, on the product page.

    Thanks,

    Michael