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LM98640QML LVDS output start-up

Other Parts Discussed in Thread: LM98640CVAL

I am doing bring-up of a LM98640QML (LM98640W-MPR) and has problems with getting something on the TXOUTx LVDS pins. The TXCLK and TXFRM behaves as expected. The TXOUTx LVDS are all at constant zero state no matter what I do. I allways starts loading the baseline configuration as specified in the data sheet, i.e. all the 62 registers including all “reserved” but expect the two read only (status and device id). I has noted reserved register address 0x24 shall be loaded with 0x34 – non-zero – is this correct?

Here is what I has tried after the baseline load:

Test 1: Nothing, i.e. baseline config

TXFRM is sample/hold – i.e. no odd/even “signaling” – TXCLK OK, TXOUTx all low

Test 2: Shift to CDS mode. Load:

0x06       ,0x01      ,//Sample & hold

0x00       ,0x05      ,//Main configuration

0x09       ,0x10      //Clock monitor

TXFRM is has odd/even “signaling” – TXCLK OK, TXOUTx all low. Can also see clamp and sample signals on DTM0 and DTM1.

Test 3: LVDS test mode. Load:

0x3D       ,0x02      ,//Test & scan control

0x38       ,0x01      ,//Test pattern value MSB

0x39       ,0x55      ,//Test pattern value LSB

0x34       ,0xe0      //Test pattern control

TXFRM is sample/hold – i.e. no odd/even “signaling” – TXCLK OK, TXOUTx all low

Has also tried Test pattern control 0x80, i.e. fixed code – same results

The INCLK is 15MHz. All “analog” seems OK. All supply OK. I have an active CLPIN signal connected

BR

Søren

  • Hello Saren,

    You are correct about address 0x24.

    Upon start up, try writing to the reqisters is this order:

    05 this is done at the initial setup to turn on and setup LVDS

    .

    .

    .

    30

    31 if you are not writing to these two (30 and 31), it is probably the reason for what you are seeing (these registers are necessary for asynchronous even though the datasheet does explicitly state it).

    32

    33

    34

    38

    39 write to these two (38 and 39) to establish the pattern

    3D

    This is the order we use when we test the part, and there may be an issue if 3D is done sooner.

    Another caution is to be sure to program the INCLK register for the input clock range to be used.

    Please let me know if this solved your issues.

    Note that we have an evaluation board available and in stock.  Below is the link to the manual.  

    http://www.ti.com/general/docs/lit/getliterature.tsp?literatureNumber=snau008&fileType=pdf

  • Some additional information about the evaluation board for this product:

    The part number is LM98640CVAL.   Due to a glitch in our systems, the ordering information is not showing up on the TI.com website.  But, you should be able to order it through your distributor.

    http://www.ti.com/general/docs/lit/getliterature.tsp?literatureNumber=snau008&fileType=pdf

     

  • Hello Kirby,

    I tried your suggested sequence:

    0x25       ,0x12      ,//INCLK range

    0x30       ,0x55      ,//Test patterns start MSB

    0x31       ,0x10      ,//Test patterns start LSB

    0x32       ,0x00      ,//Test patter width MSB

    0x33       ,0x01      ,//Test patter width LSB

    0x34       ,0xe0      ,//Test pattern control

    0x38       ,0x01      ,//Test pattern value MSB

    0x39       ,0x55      ,//Test pattern value LSB

    0x3D       ,0x02      //Test & scan control

    Same result: TXFRM OK, TXCLK OK, TXOUTx all low

    My INCLK setting matched my INCLK of 15MHz – agree?

    I reviewed once more my baseline configuration (loaded before the above setting) against the datasheet…

     

    Tried to reset the DLL after INCLK setting

    0x28       ,0x0F      ,//DLL Configuration

    Same result… Again…some reserved bits which are non-zero?

     

    Tried to reset the serializer by:

    0x05       ,0x8E      ,//LVDS output modes

    0x05       ,0x0E      ,//LVDS output modes

    Same result…

     

    Tried to toggle test reset by:

     0x3D       ,0x06      ,//Test & scan control

    0x3D       ,0x02      //Test & scan control

    Same result…

     

    Tried another test mode

    0x34       ,0x80      ,//Test pattern control

    Same result…

    Is it possible for you to send the baseline configuration (clip from source code or other format is OK) you are using in you evaluation board test SW. Maybe also some configuration which are known to generate data output. I has attached my baseline load sequence…

    I has a feeling there is something “basic” wrong. Also important to note the TXFRM and TXCLK behave as expected – it is only the TXOUTx. The TXOUTx has  correct LVDS bias and differential voltage “low” state. What can prevent the TXOUTx being active when the framing and clocks are OK? Also note I has not being able to see TXOUTx activity in normal mode…but this could be some error in the analog settings...but also here I has tried playing around but has never seen activity on TXOUTx.

    BR

    Søren

  • Soren,

    When you respond back to me, please do so directly:

    kirby.kruckmeyer@ti.com

    Have you tried to read back the registers to ensure they are correct?

    How are you monitoring the output signals?  Is it with a high speed differential probe?

    I am trying to find some source code I could send you.   I hope to have this done on Monday.

    Do you want to send me the schematic of your system to review.

  • Hello Soren and Kirby,

    I come in this thread because I had exactly the same issue of Saren to enable the LVDS test mode on the LM98640. And now it's works fine.

    The tricks is to initialize only the non-reserved registers with the Baseline values and now the LVDS test mode works fine. When I was initializing the registered value, I was not able to enable the Test Mode

    Cheers

    Vincent