• State TI Thinks Resolved
  • Locked Locked
  • Replies 5 replies
  • Answers 1 answer
  • Subscribers 31 subscribers
  • Views 845 views
  • Users 0 members are here
Support feedback
Options
Options
Similar topics

This thread has been locked.

If you have a related question, please click the "Ask a related question" button in the top right corner. The newly created question will be automatically linked to this question.

SN65LVDS180-Q1: Having trouble meeting 1mA limit of ICC Disabled test at -40C.

Lance Brown
Prodigy 50 points
Part Number: SN65LVDS180-Q1
Other Parts Discussed in Thread: SN65LVDS180

This parameter ICC is stated 4 ways on the datasheet, once for active and 3 ways for disabled conditions.  I am having trouble meeting the 1mA limit at -40C for the "Disabled" test.  

There are no setup conditions  given but I assume the DE pin is driven low and /RE pin drive high.  I am using 0V and VCC on those pins and believe all other inputs are don't care.  VCC is 3.6V during the test.  The test works fine at room and hot but fails many of my samples at cold.  I am hoping to get some insight into the manufacturer's test setup conditions, and make sure this is actually production tested.  Also it might be helpful to know what is the difference between SN65LVDS180-Q1 and SN65LVDS180? 

  • 0
    TI__Intellectual 2915 points
    Hi Lance,

    What are DUT temp and air temp? It could fail due to frost-over. When you said not meeting 1mA max spec, what exactly the ICC current were you measured?

    Regards,
    Dennis
  • 0 in reply to Dennis Wu
    Prodigy 50 points

    DUT is at -40C as measured with a thermal couple underneath the device.  Air forcing is set to drive the DUT to -40C, and settles in around -45 or less once the device has soaked for awhile.  I have dry air forcing into the DUT socket so it is not moisture.  I am testing this on ATE.  For setup conditions VCC is at 3.6V, /RE pin is being forced to 3.6V and DE pin is being forced to 0V.  The inputs are don't care but I don't want to float them so am also forcing them to 3.6V but forcing inputs to 0V gives same measurement.  I am using plenty of time (100mS) delay before taking the measurement.  The parts pass at room and 105C with plenty of margin but I see around 2mA against the 1mA limit at -40C.

  • 0 in reply to Lance Brown
    TI__Intellectual 2915 points
    Hi Lance,

    The setup condition looks good to me. This is the way you supposed to test. Have you tried to float input pins? What is the ATE tester resolution on the current measurement? Do you see the leakage current gradually increase over time during 3-5 mins soak?

    This device has been released long time ago. Is this SOIC or TSSOP package?

    Can you send the schematic and a photo of ATE board? It would be good if you can include a photo of whole test setup at -40C (ATE board and thermostream). My email is dennis.wu@ti.com

    Regards,
    Dennis
  • 0 in reply to Dennis Wu
    TI__Intellectual 2915 points

    Hi Lance,

    From the data below, the power down ICC (ICC_DIS) measurement at -40C.  The average value was 594 uA.

    Hope this helps.

    Dennis

  • 0 in reply to Dennis Wu
    Prodigy 50 points
    Thanks, I just sent you an email to the address you supplied. Curious what the inputs are doing during this test....