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SN65HVD3083E: IC destruction when noise enters the input/output terminals (A, B, Z, Y)

Dice-K
Mastermind 6620 points
Part Number: SN65HVD3083E

Hello.

When there is noise such as lightning surge at input/output terminals (A, B, Z, Y) when communication (transmission, reception) is not done.
If transmission is enabled (DE pin = High), is it effective for IC  failure (destruction) tolerance?
If the condition of the DE terminal is not related to destruction, please answer like that.

Reception is always enabled (RE pin = Low).

* Reason for question
When I do not transmit, I want to refer to how to deal with the DE terminal to see if it is effective against IC destruction.

Regards,
Dice-K

  • 0
    TI__Expert 3770 points
    Hi Dice-K,

    thanks for reaching out. I don't know if I understand your question correctly so let me know in case I'm wrong.

    You are using the transceiver SN65HVD3083 to communicate but due to a surge impulse, your communication can't be performed. The RE pin is always kept low which means receiver always enabled, and you are wondering how to handle the DE pin in order to increase robustness of the transceiver to surge immunity, right?

    Usually the devices get tested according to the JEDEC Standard 22 and we keep track of how each device performs depending on the pin configuration. In this case, since the device isn't the latest, I'll have to search specifically for it. I'll let you know shortly if the state of DE being pulled high or low could affect the surge immunity.

    In the meantime, please let me know if my understanding is correct.

    Thank you and best regards,
    Adrian
  • 0 in reply to Adrian Ymeraj
    Mastermind 6620 points
    Hello Adrian,
    Thank you for your reply. You understand my question.

    Does the following sentence mean that the strength of surge immunity is not related to that DE is High or Low?

    "I'll let you know shortly if the state of DE being pulled high or low could affect the surge immunity.""

    Best regards,
    Dice-K
  • 0 in reply to Dice-K
    TI__Expert 3770 points

    Hi Dice-K,

    I'm still trying to find the right documentation that would answer your question. I can only tell that during the testing phase we keep track of the pins state, but in this case the device is quite old and it's difficult to find the document.

    I'll update you as soon as I have any info.

    Thank you for your patience!

    Best regards,

    Adrian

  • 0 in reply to Adrian Ymeraj
    Mastermind 6620 points

    Hi Adrian,
    Thank you for your sopport.

    Plesase let me know if you find a new information.

    Best regards,
    Dice-K

  • 0 in reply to Dice-K
    TI__Expert 3770 points
    Hi Dice-K,

    apparently it's very difficult to find information on how the test was performed and I could only find that since the DE pin is a non-supply pin , it gets either pulled to GND or left floating during our testing. So unfortunately we don't have other tests on this device regarding DE pulled high for surge test.
    Again, I'm sorry that we don't test the device with that pin state but just for your knowledge, I can refer to other devices which actually get tested with DE both pulled high and low, and in these devices we don't really see a huge difference in robustness of the transceiver.

    Having said this, I'm definitely not saying that in this specific case you will see exactly the same result in robustness on surge immunity, it's only to give you a trend on other devices.

    I hope this gives you some more ideas, please let me know if you have any other question.

    Best regards,
    Adrian