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ISOS141-SEP: Radiation question

Lauren Adachi
Prodigy 90 points
Part Number: ISOS141-SEP

Does this part experience any SEFIs that require power cycle or is it just transients? Or has no data been collected on this? Thanks

  • 0
    TI__Expert 7315 points

    Hello,

    Thank you for your question.

    Can you please explain what SEFIs are?

    If your question is related to radiation tests, the following tests are conducted as stated in the datasheet:

    – Total Ionizing Dose (TID) Characterized (ELDRS-Free) = 30 krad(Si)

    – TID RLAT/RHA = 30 krad(Si)

    – Single-Event Latch-up (SEL) Immune to LET = 43 MeV⋅cm2 /mg at 125°C

    – Single-Event Dielectric Rupture (SEDR) Immune (43 MeV⋅cm2 /mg) at 500 VDC

    Regards,
    Aaditya Vittal

  • 0 in reply to Aaditya Vittal
    Prodigy 90 points

    Sure, SEFI=single event functional interrupt. Is there data available on if during SEE test (to LET=43Mevcm^2/mg) there were any transient waveforms or functional interrupts (eg a pin went high or low and was stuck there) that were only solved via power cycle? Or were these types of events not observed/monitored during the test?

  • 0 in reply to Lauren Adachi
    TI__Mastermind 24665 points

    Hello Lauren,

    Please allow us another couple days to get back to you with more information.

    Best,
    Michael

  • +1 in reply to Lauren Adachi
    TI__Expert 7315 points

    Hi Lauren,

    Thank you for the additional information.

    During radiation tests, the current consumption of the device was monitored to make sure it does not fluctuate to call it a pass. A steady current means that the I/O is not changing and hence, the device was functional during the test.

    Please let me know if this is answers your question.

    Regards,
    Aaditya Vittal