We are a universal programmer manufacturer and now working on the algorithm development for TMS470R1A384.
We've met a problem in mode entry. Anybody can help me? Thanks.
Problem:
We fail to enter debug mode. When we check Debug Status Register, the data we get is 0x16.
In addition, after IDCODE command is issued, the ID value read back is 0xE02F, 0x 3100.
The programming specification we are referring to is tms470r1x_jtag_revision2.2.pdf.
What do you think causes this problem?
The following are our pin setting and mode entry flow.
Thanks!
PIN Setting
VCCIO = VCCP = ADREFHI = VCCAD = 3.3V
VCC = 1.8V
VSS, ADREFLO,VSSAD, TEST connect to Ground
1. Initial TAP to Run-Test/Idle
//Initial PIN state
IO(TCK_Port) = 1; ! TCK -> higt
IO(TMS_Port) = 1; ! TMS -> high
IO(TDI_Port) = 0; ! TDI -> low
IO(TDO_Port) = 1; ! floating TDO to Z-high
//release TRST
IO(TRST_Port) = 0; ! TRST -> low
Delay_10us_Scale;
IO(TRST_Port) = 1; ! TRST -> high
Delay_2us_Scale;
//Go to Run-Test/Idle
IO(TMS_Port) = 1; ! TMS -> high
CALL TCK_10_Pulse; ! TCK plus 10 more times to go to Test-Logic-Reset
IO(TMS_Port) =0; ! TMS -> low
CALL TCK_1_Pulse; ! Go to Run-Test-Idle
3. Get IDCODE then go to Run-Test/Idle
After executing IDCODE instruction, we Read out data 0xE02F, 0x 3100
4. Select and activate scan chain 2
// JTAG instruction SCAN_N scan in, then go to Run-Test/Idle
IO(TMS_Port) = 1; ! TMS -> high
CALL TCK_1_Pulse; ! Go to Select-DR-Scan
CALL TCK_1_Pulse; ! Go to Select-IR-Scan
IO(TMS_Port) = 0; ! TMS -> low
CALL TCK_1_Pulse; ! Go to Capture-IR
CALL TCK_1_Pulse; ! Go to Shift-IR
AR = 2;
DM(Data_In) = AR;
CALL shift_instruction_Run-Test/Idle;
// JTAG data 0x2 scan in, then go to Updae-DR
IO(TMS_Port) = 1; ! TMS -> high
CALL TCK_1_Pulse; ! Go to Select-DR-Scan
IO(TMS_Port) = 0; ! TMS -> low
CALL TCK_1_Pulse; ! Go to Capture-DR
CALL TCK_1_Pulse; ! Go to Shift-DR
AR = 2; ! scan chain number
DM(Data_In) = AR;
CALL shift_instruction_Updae-DR/IR;
// JTAG instruction INTEST scan in, then go to then go to Run-Test/Idle
IO(TMS_Port) = 1; ! TMS -> high
CALL TCK_1_Pulse; ! Go to Select-DR-Scan
CALL TCK_1_Pulse; ! Go to Select-IR-Scan
IO(TMS_Port) = 0; ! TMS -> low
CALL TCK_1_Pulse; ! Go to Capture-IR
CALL TCK_1_Pulse; ! Go to Shift-IR
AR = 0xC;
DM(Data_In) = AR;
CALL shift_instruction_Run-Test/Idle;
5. Set DBGRQ bit in Debug Control Register then go to Run-Test-Idle
IO(TMS_Port) = 1; ! TMS -> high
CALL TCK_1_Pulse; ! Go to Select-DR-Scan
IO(TMS_Port) = 0; ! TMS -> low
CALL TCK_1_Pulse; ! Go to Capture-DR
CALL TCK_1_Pulse; ! Go to Shift-DR
AR = 16;
DM(Data_Len) = AR;
AR = 0x02; ! low word
DM(Data_In) = AR;
CALL shift_instr_inScan2;
AR = 0x00; ! high word
DM(Data_In) = AR;
CALL shift_instr_inScan2;
AR = 5;
DM(Data_Len) = AR;
AR = 0x00; ! EmbeddedICE Debug Control Register address
DM(Data_In) = AR;
CALL shift_instr_inScan2;
AR = 0x01; ! write bit
IO(TDI_Port) = AR; ! last bit shift 'in'
IO(TMS_Port) = 1; ! TMS -> high
CALL TCK_1_Pulse; ! Go to Exit1-DR
CALL TCK_1_Pulse; ! Go to Update-DR
IO(TMS_Port) = 0; ! TMS -> low
CALL TCK_1_Pulse; ! Go to Run-Test-Idle
6. Check if TMS470R1x Core is in Debug mode, read Debug Status Register
IO(TMS_Port) = 1; ! TMS -> high
CALL TCK_1_Pulse; ! Go to Select-DR-Scan
IO(TMS_Port) = 0; ! TMS -> low
CALL TCK_1_Pulse; ! Go to Capture-DR
CALL TCK_1_Pulse; ! Go to Shift-DR
AR = 16;
DM(Data_Len) = AR;
AR = 0x00; ! low word
DM(Data_In) = AR;
CALL shift_instr_inScan2;
AR=DM(Data_Out);
DM(Data_Out1) = AR;
AR =0x00; ! high word
DM(Data_In) = AR;
CALL shift_instr_inScan2;
AR=DM(Data_Out);
DM(Data_Out2) = AR;
AR = 5;
DM(Data_Len) = AR;
AR = 0x01; ! EmbeddedICE Debug Status Register address
DM(Data_In) = AR;
CALL shift_instr_inScan2;
AR = 0x00; ! read bit
IO(TDI_Port) = AR; ! last bit shift 'in'
IO(TMS_Port) = 1; ! TMS -> high
CALL TCK_1_Pulse; ! Go to Exit1-DR
AR = IO(TDO_Port); ! a bit shift 'out'
AR = IO(PD_Data_Get_Port);
CALL TCK_1_Pulse; ! Go to Update-DR
IO(TMS_Port) =0; ! TMS -> low
CALL TCK_1_Pulse; ! Go to Run-Test-Idle
Repeat step 6 more times, we still get data 0x16 from Debug Status Register,
DBGACK(bit0) = 0, nMREQ = 0, we fail to enter the debug mode.
//Subroutine:
MX1 = 1;
MY1 = 0;
shift_instruction_Run-Test/Idle:
AY0=0x1;
AR = DM(Data_In);
CNTR = 3;
DO shift_loop_1 UNTIL CE;
IO(TDI_Port) = AR;
CALL TCK_1_Pulse;
SR = LSHIFT AR BY -1(LO);
AR = SR0;
DM(Data_In)=AR;
AR = IO(TDO_Port);
AR = IO(PD_Data_Get_Port);
AR = AR AND AY0;
AY1 = AR;
AR = DM(Data_Out);
SR = LSHIFT AR BY 1 (LO);
AR = SR0 OR AY1;
DM(Data_Out) = AR;
shift_loop_1: AR=DM(Data_In);
IO(TDI_Port) = AR;
IO(TMS_Port) = MX1;
CALL TCK_1_Pulse;
AR = IO(TDO_Port);
AR = IO(PD_Data_Get_Port);
AR = AR AND AY0;
AY1 = AR;
AR = DM(Data_Out);
SR = LSHIFT AR BY 1 (LO);
AR = SR0 OR AY1;
DM(Data_Out) = AR;
CALL TCK_1_Pulse;
IO(TMS_Port) = MY1; ! TMS -> low
CALL TCK_1_Pulse; ! Go to Run-Test-Idle
RTS;
shift_instruction_Updae-DR/IR:
AY0=0x1;
AR = DM(Data_In);
CNTR = 3;
DO shift_loop UNTIL CE;
IO(TDI_Port) = AR;
CALL TCK_1_Pulse;
SR = LSHIFT AR BY -1(LO);
AR = SR0;
DM(Data_In)=AR;
AR = IO(TDO_Port);
AR = IO(PD_Data_Get_Port);
AR = AR AND AY0;
AY1 = AR;
AR = DM(Data_Out);
SR = LSHIFT AR BY 1 (LO);
AR = SR0 OR AY1;
DM(Data_Out) = AR;
shift_loop: AR=DM(Data_In);
IO(TDI_Port) = AR;
IO(TMS_Port) = MX1;
CALL TCK_1_Pulse;
AR = IO(TDO_Port);
AR = IO(PD_Data_Get_Port);
AR = AR AND AY0;
AY1 = AR;
AR = DM(Data_Out);
SR = LSHIFT AR BY 1 (LO);
AR = SR0 OR AY1;
DM(Data_Out) = AR;
CALL TCK_1_Pulse; Go to Update-IR/DR
RTS;
shift_instr_inScan2:
DM(Data_Out)=MY1;
AR = DM(Data_Len);
CNTR = AR;
AR = DM(Data_In);
AY0=0x8000;
DO Scan2_loop UNTIL CE;
IO(TDI_Port) = AR;
CALL TCK_1_Pulse;
SR = LSHIFT AR BY -1(LO);
AR = SR0;
DM(Data_In)=AR;
AR = IO(TDO_Port);
AR = IO(PD_Data_Get_Port);
SR = LSHIFT AR BY 15 (LO);
AR = SR0 AND AY0;
AY1 = AR;
AR = DM(Data_Out);
SR = LSHIFT AR BY -1 (LO);
AR = SR0 OR AY1;
DM(Data_Out) = AR;
Scan2_loop: AR=DM(Data_In);
