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My customer tested a 2A current when the circuit is shorted. The waveforms are attached. Does this current damage the device or affect the device reliability?
Is the attached waveform showing a simulated expected normal operating condition, or is the repeated short-circuiting just a test setup?
In general this 2-A peak current won't damage the device. However, if the short-circuit event was repeatedly applied as in the attached waveform, there would be repeated temperature fluctuations, and I would expect that over time it could impact device reliability. If the short-circuit is only a fault condition and not a normal condition then this large peak current is not an issue.
The reason they are seeing a current spike that is larger than the current limit for this device is that the current limit circuit takes a finite amount of time to respond and limit the current. This is normal for many devices.
To clarify, what I meant in my first comment is that in the attached waveform, there is a periodic short-circuit applied to the output of the device, and if the operating conditions in their application do not have a periodic short-circuit (I would expect that they don't have a periodic short-circuit because this is a fault condition), this is not an issue from the perspective of the LDO.
