Hello Team,
We are using 1GB LPDDR4 DRAM from ISSI - IS46LQ32256EA-062B2LA3, where while doing the DDR stress test we are seeing that the Walking 0s is failing continuously. This pattern we are observing in multiple iterations. We have used the DDR configuration settings as per our SI simulation results which is attached.
We are able to load the binaries through UART and we see that booting is happening.
The diagnostics steps is as per the user guide and the Gel file for DDR is taken from the configuration excel sheet, DDR diag source code is also attached. Could you please help on debugging the same. LPDDR4_report_LPDDR4_Read.pdfLPDDR4_report_LPDDR4_Write.pdfboard_diag_mem_mcu1_0_debug - Copy xer5f.txt
Below is the log observed on MCU UART
****************************************************
* DDR Memory Stress Test *
****************************************************
board_external_memory_test: Start address (0x80000000), end address (0xffffffff)
First test started
Writing to test area...
Write up to 0x80000000 done
Write up to 0x90000000 done
Write up to 0xa0000000 done
Write up to 0xb0000000 done
Write up to 0xc0000000 done
Write up to 0xd0000000 done
Write up to 0xe0000000 done
Write up to 0xf0000000 done
Write finished!
Checking values...
Read up to 0x80000000 okay
Read up to 0x90000000 okay
Read up to 0xa0000000 okay
Read up to 0xb0000000 okay
board_memory_test: Failed at address index = 0xc0000000 value = 0xbfffffc0 *(index) = 0x0
Board memory test failed!
walking1s test verified up to 0x80000000 done
walking1s test verified up to 0x90000000 done
walking1s test verified up to 0xa0000000 done
walking1s test verified up to 0xb0000000 done
DDR Walking 1's Test Failed at Location 0xc0000000
walking1s test failed!
DDR Walking 0's Test Failed at Location 0x80000000
walking0s test failed!
Memory test failed!