Other Parts Discussed in Thread: SN65HVD233,
Experiencing similar issues, even with the ceramic part rated to 210C. Was a solution found?
Thank you,
Stephen
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Experiencing similar issues, even with the ceramic part rated to 210C. Was a solution found?
Thank you,
Stephen
Hi Stephen,
I was able to trace some internal communications regarding the previous E2E thread, but I was not able to find if the issue was resolved. Luckily the information I can access elaborates more on the testing that was done. Would you be able to provide more information on your testing so that we can see if this may be a similar occurrence?
1. At what time and temperature during the test does the failure occur?
2. In what way does the device fail? - If there is a communication failure, would you be able to share scope shots of the CAN bus being driven by the failed part?
3. How many devices have failed the test? - Are the failure results repeatable and if so at what rate?
4. Do other devices in the system fail as well? - Other ICs, traces, passive components, etc. Could any of this cause a transient or surge event?
5. What other devices are connected to SN65HVD233 during the test? - Is communication present during the test? Could you share a schematic?
6. Could you share the marking that are on the top of the failed device(s)?
Regards,
Eric
Hi Stephen,
Were you able to find a solution for the SN65HVD233-HT failure at high temp?
Regards,
Eric