I'm having a very peculiar problem on a design that is using the LMV762MMX. In manufacturing I am seeing about a 20-30% failure on the A component output (pin 1) of the LMV762. The B component output (pin 7) is working properly.
Here's a bit of background, I have redundant circuits that monitor temperature and the pair of comparators in one package monitor the open and short condition of the RTD. When a failure occurs both comparator packages for monitoring the open condition (A) fail to logic low on both of the redundant circuits (the short monitor sections (B) continue to work properly. The inputs to each of the comparators is buffered by LMP2012 op-amps.
The LMV762 are powered at 5V and feed into a 3.3V CPLD which is 5V tolerant.
Is there a layout difference in the A comparator and the B comparator die/packaging that may cause one to fail over another?
Would power up sequencing be a possible cause?
Thank you for your time in reviewing the problem.
~Denis