Hello,
We have been working with the TI E2E community to develop a high-speed solar cell open-circuit voltage decay measurement system. We have the following setup:
Solar Cell (device under test, single ended output) --> OPA659EVM (unity gain amplifier with the 50 Ohm resistor going from the non-inverting input to ground removed, single ended output) --> LMH5401EVM (single ended input to differential output with common mode voltage set to the optimum for ADC) --> ADC12J4000EVM (high-speed ADC) --> TSW14J56EVM (high-speed data capture board).
The 50 Ohm resistor (going from the non-inverting input to ground) on the OPA659EVM baord was removed because we need to measure devices under the open-circuit condition. This resistor does not allow the open-circuit condition for the device under test.
The issue we are having is that there is both high (~1MHz) and low (~1 kHz) frequency noise in the measurements of the open-circuit voltage decay of solar cells. The noise is dependent on the capacitance of the device under test. Is there any method of eliminating this noise?
Thanks,
Alex