Other Parts Discussed in Thread: TMS570LS1115,
hi,when i Debug MCU diagnostics,
In the diagnosis process of Sram 2bit ECC, it was interrupted by RTI interruption, and 2bit ECC failure was triggered in the interrupt process, and MCU triggered reset. In the startup code, PBIST self-check of Sram could not be completed all the time, and remained in the following code, may I ask what is the reason?

Can MCU be interrupted by external interruption during the process of calling the diagnostic library for diagnosis?

