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Original question:
I am trying to run a self-test of the ECC feature on the CAN module of the TMS570LC4357. These are the steps I am following:
1. Enable SECDED
2. Trigger hardware initialization of DCAN SRAM
3. Disable SECDED
4. Enable Test and Init in the CTL register
5. Enable ECC diagnostic mode in the ECCDIAG register
6. Enable RAM direct access
7. Flip first bit of CAN ECC
8. Disable init mode in CTL register
9. Enable SECDED
8. Read the beginning of the CAN RAM
A few questions:
1. These steps do not yield an error in the ECCDIAG_STAT register. Is there a step I am doing incorrectly? I have tried writing to ECC bits at 0xFF1E1020 and reading the corresponding RAM at 0xFF1E0020
2. Does TI provide these tests anywhere for ECC? I see that there are provided tests for other TMS570 variants, but for parity checking.
