TMS570LS3137: displacement damage susceptibility for the TMS570LS3137-SEP

Hi Luca,

TMS570_S3137 doesn't support -SEP grade, but TMS570LC4357 does.

Hi QJ, thanks for the very prompt reply.

I must have made a mistake in pasting the part number ... but yes, my question concerns the rad tolerant part TMS570LC4357-SEP.

Best Regards

Luca

Hi Luca,

Attached is the SEL radiation report. https://www.ti.com/lit/an/spna249/spna249.pdf

The TID radiation report is still under review and will be published soon.

Hi QJ,

indeed, I had already downloaded SEL report, though in it I was unable to find any suggestion about a safe current limit value (by safe meaning: the value of the supply current below which a Latch-Up may occur without irreversibly damaging the part). That was this question:

- what is the suggested safe current limit value to apply during a Latch-Up condition?

Thanks for the tip about the TID Test Report, I will periodically check the webpage for it.

I am looking forward to the reply of your experts concerning the question addressing TNID (Total Non Ionizing Dose, or in other words Displacement Damage):

- However, we have no idea about whether Displacement Damage effects might be of concern. Typically, we have never seen MCUs listed among those types of components known to be susceptible to DD (such as for example, bipolars, optocouplers, etc.). However, it would help to collect TI's experts opinions about it.

Best Regards

Luca

Hi Luca,

The SEL report demonstrates that the device is SEL-free up to 48 MeV-cm2/mg at 128 degree and with maximum voltage supplies. 

We don't have TNID test report.

Hi QJ,

in fact, I was not asking for a TNID test report, but simply to verify with TI radiation experts whether, because of the particular technology process used for its manufacturing, the TMS570LC4357-SEP is susceptible to Dispacement Damage degradation, or not.

Hi Luca,

I will let you know upon I got response from our expert.