TMS320F28069M: F28069 LaunchPad SCI/USB isn't recognized by windows 11 device manager

Hi Allison,

Here is all image that related to LaunchPad.

Thanks,

Jiakai

Hello,

Please also double check with the trouble shooting guide to ensure you are able to connect: https://software-dl.ti.com/ccs/esd/documents/ccsv7_debugging_jtag_connectivity_issues.html#troubleshooting-the-connect-phase

Best Regards,

Allison

Hi Allison,

I can debug code on the LaunchPad normally, only have issue to recognize USB/SCI, I want to get data out from XDS-100 USB cable. Could you please narrow it down with a little more detail in trouble shooting?

Hi Jiakai,

Can you make sure the switch enabling the UART-to-USB bridge on the LaunchPAD is in the correct position for the GPIOs you have selected: 

Also, just to verify, you are able to connect the debugger to the LaunchPAD in CCS without issues? And the power LEDs on the board are on when you plug it into your PC?

Best Regards,

Delaney

Hi Delaney,

I have double checked it (JP7: ON, JP6: OFF). I can run code in my LaunchPad without any problem. Power LED is on.

Hello,

Can you please open CCS, open the device .ccxml file and click the "Test connection" button to test your debug connection to the device and ensure there are no issues there?

Best Regards,

Allison

Hi Allison, the followings are the content I got when I hit "Test Connection button:

[Start: Texas Instruments XDS100v2 USB Debug Probe_0]

Execute the command:

%ccs_base%/common/uscif/dbgjtag -f %boarddatafile% -rv -o -F inform,logfile=yes -S pathlength -S integrity

[Result]

-----[Print the board config pathname(s)]------------------------------------

C:\Users\jye\AppData\Local\TEXASI~1\CCS\
ccs1281\0\0\BrdDat\testBoard.dat

-----[Print the reset-command software log-file]-----------------------------

This utility has selected a 100/110/510 class product.
This utility will load the adapter 'jioserdesusb.dll'.
The library build date was 'Sep 26 2024'.
The library build time was '10:09:41'.
The library package version is '20.0.0.3178'.
The library component version is '35.35.0.0'.
The controller does not use a programmable FPGA.
The controller has a version number of '4' (0x00000004).
The controller has an insertion length of '0' (0x00000000).
This utility will attempt to reset the controller.
This utility has successfully reset the controller.

-----[Print the reset-command hardware log-file]-----------------------------

The scan-path will be reset by toggling the JTAG TRST signal.
The controller is the FTDI FT2232 with USB interface.
The link from controller to target is direct (without cable).
The software is configured for FTDI FT2232 features.
The controller cannot monitor the value on the EMU[0] pin.
The controller cannot monitor the value on the EMU[1] pin.
The controller cannot control the timing on output pins.
The controller cannot control the timing on input pins.
The scan-path link-delay has been set to exactly '0' (0x0000).

-----[The log-file for the JTAG TCLK output generated from the PLL]----------

There is no hardware for programming the JTAG TCLK frequency.

-----[Measure the source and frequency of the final JTAG TCLKR input]--------

There is no hardware for measuring the JTAG TCLK frequency.

-----[Perform the standard path-length test on the JTAG IR and DR]-----------

This path-length test uses blocks of 64 32-bit words.

The test for the JTAG IR instruction path-length succeeded.
The JTAG IR instruction path-length is 38 bits.

The test for the JTAG DR bypass path-length succeeded.
The JTAG DR bypass path-length is 1 bits.

-----[Perform the Integrity scan-test on the JTAG IR]------------------------

This test will use blocks of 64 32-bit words.
This test will be applied just once.

Do a test using 0xFFFFFFFF.
Scan tests: 1, skipped: 0, failed: 0
Do a test using 0x00000000.
Scan tests: 2, skipped: 0, failed: 0
Do a test using 0xFE03E0E2.
Scan tests: 3, skipped: 0, failed: 0
Do a test using 0x01FC1F1D.
Scan tests: 4, skipped: 0, failed: 0
Do a test using 0x5533CCAA.
Scan tests: 5, skipped: 0, failed: 0
Do a test using 0xAACC3355.
Scan tests: 6, skipped: 0, failed: 0
All of the values were scanned correctly.

The JTAG IR Integrity scan-test has succeeded.

-----[Perform the Integrity scan-test on the JTAG DR]------------------------

This test will use blocks of 64 32-bit words.
This test will be applied just once.

Do a test using 0xFFFFFFFF.
Scan tests: 1, skipped: 0, failed: 0
Do a test using 0x00000000.
Scan tests: 2, skipped: 0, failed: 0
Do a test using 0xFE03E0E2.
Scan tests: 3, skipped: 0, failed: 0
Do a test using 0x01FC1F1D.
Scan tests: 4, skipped: 0, failed: 0
Do a test using 0x5533CCAA.
Scan tests: 5, skipped: 0, failed: 0
Do a test using 0xAACC3355.
Scan tests: 6, skipped: 0, failed: 0
All of the values were scanned correctly.

The JTAG DR Integrity scan-test has succeeded.

[End: Texas Instruments XDS100v2 USB Debug Probe_0]