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Hello,
Me and my customer are studying 'IEC60730 Safety library', that is, IEC60730SWPACKAGES http://www.ti.com/tool/IEC60730SWPACKAGES
I hope you have the spec IEC60730-1, although I don't.
According to my customer, the document has Table H.1, and the table requires some about 'Internal data path' and 'Internal data address'.
Their question is, which functional blocks in the F28377D should be tested for 'Internal data path' and 'Internal data address' ?
Does it make sense and could you please advise?
By the way, they targets Class-B.
Hello,
We would wait for your response.
Please tell me if our question doesn't make sense.
Sal,
I appreciate your response.
Can I confirm your reply, do you mean that the HWBIST, or STL_HWBIST_runFull() covers both the {5.1 and 5.2} ?
I'm looking into the Table-4 in the SW Safety Manual (SPRUIH0.pdf).
From the table I could not find the relationship between your word "HWBIST" and {5.1 Internal Data path – Data and 5.2 Internal Data path - Addressing}.
I'm a newbie, so maybe your word would be difficult for me.
I could understand that the three STLs {stl_flash, stl_march, stl_ram} covers the components {5.1 Internal Data path – Data and 5.2 Internal Data path - Addressing}.
Hi Hideaki,
You are correct. For 5.1 and 5.2, stl_ram, stl_flash, stl_march, and stl_pie_ram are designed to meet the component requirements.
STL_HWBIST is for component 1, which tests the C28x CPU. I was not sure which type of data path you were referring too.
Let me know if you have any other questions.
Thanks,
sal
Sal,
Can we ask TI about simplification from class-C to class-B?
For example, the part has ECC and parity logics, so it is expected to satisfy the class-B without stl_flash or stl_ram.
Is it wrong, or up to other implementations?