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TPS25982: Unable to turn off despite pulling EN low

Part Number: TPS25982

This may be related to a previously reported issue though has been seen to occur at low and ambient temperatures: https://e2e.ti.com/support/power-management-group/power-management/f/power-management-forum/1235920/tps25982-cannot-turn-off-at-low-temperatures--30c

I'm experiencing an issue with the TPS25982 smart efuse where it occasionally does not turn OFF despite EN being pulled low. Output will remain at 12V and source current until the input power supply is cycled at which point it will then behave as expected until the issue recurs. 

The latch-up failure has been observed at various package temperatures from -40°C up to 15°C. Most of our observed failures happen at low temperatures <-20°C. We have observed rare failures up to 15°C. Failures at low temperatures seem to recur more reliably than those at ambient temperatures (ie. ICs that show latch-up at low temperature tend to have every enable-disable cycle at low temp remain latched up, very rare to observe latch up at ambient temperatures).

The failure has been observed with and without loads connected (ie. output is disconnected, only measuring output voltage via voltage divider). 

The failure has been observed with and without schottky diodes installed on output to clamp any negative voltage transients. 

We have several dozen other TPS25982 ICs in an identical, unmodified circuit that have never exhibited this behavior. Replacing the faulty ICs tends to resolve the issue but we can't reliably induce the failure to confirm this. 

Schematic is shown below: 

VIN and VOUT both have TVS diodes to GND. 

Plot showing latching behavior:

V_IN remains at approx 13V.

EN cycles on and off. I've confirmed with scope that the EN pin voltage matches the shown boolean behavior (1 = high = 3.3V measured, 0 = low = 0V measured)

V_OUT behaves as expected for 1 cycle. On the second cycle, V_OUT remains high despite EN going low.

Do you know what might be causing this? How can we mitigate this failure? 

  • Hi Jarad,

    We will get back to you early next week.

    Best Regards,
    Arush

  • Hi Jarad,

    Can you confirm following:

    • Is same IC failing again which recovers back after the Power cycle?
    • Is there any permanent fail? If yes, then did you apply for Failure analysis yet? 
    • How many failed ICs (later recovered or did not recover) have you seen? 
    • Do you have any other signals probed during the test? Signals like DVDT, PG
    • When you mentioned with load, can you tell some more information about your load. 
    • Can you tell part number of Schottky diode. 

    Best Regards,
    Arush

  • Hi Arush,

    • Yes, the same IC fails again that recovers after the power cycle. 
    • We have not seen any permanent failures, either failing open or short. 
    • We have a failure rate of about 15% 
    • I do not have any other traces that I can provide. We do monitor PG via a microcontroller that raises an alarm if PG is not asserted. We have not seen this alarm raised during the latching events. 
    • The loads used have been both electronic loads regulating to constant current and inductive loads from relay coils. 
    • The Schottky diode we used was STPS1L30A. 

    Thank you,

    Jared

  • Hi Jared,

    One possible reason for this temporary latch up is negative transients at output. It is possible that uC is not catching them if its sampling is slow. These transients can be in microseconds time range.

    • Is this same board from the previous thread?
    • Is there any specific location which is failing, or different locations are all failing?
    • Is there any specific board which is failing or failing from different boards? 
    • Did you try adding some output capacitor. This will help reducing the transients. 
    • What were the take aways from the previous attempt in solving this issue. Did your colleague ("Aratrik") found anything which can help in solving this issue? 
    • Fail rate of 15% (very high) signifies that there is some application related issue and not device defect. If you feel otherwise, you can share details (lot number) of failing IC. I get check if there is any issue with the lot. Also, can you share number of temporarily failed devices. 
    • Did you try this with our EVM board? Does your board contain test points through which you can probe the signals and use oscilloscope to capture them. 

    Please understand that I am asking many questions is just because these types of fails are very difficult to replicate otherwise, I would have tried replicating this on bench. 

    Best Regards,
    Arush

  • Hi Jared,

    Any progress/update on this? Did you guys submit this part for failure analysis? 

    Best Regards,
    Arush