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VFC110: VCF110 Card EMI/EMC Tests including Surge : Lifetime expectancy degradation?

Varunesh Kumar
Intellectual 860 points
Part Number: VFC110

Hello 

We have some Signal Isolator using VFC110 with Fiber Optic Interface for shipment to France.

I can share the full Ckt if you want, but basically a TIA followed by V to F , transmission thru' FO

and on receiving end a F to V , followed by Butterworth Filters and level shifting for 0-10 to 0-10 V

Multiple cards are inserted in a 19 Inch Rack and the whole system works on 230 V AC .

Several such 19 Inch Racks with Cards have been tested for EMI/EMC , IEC 61000 Series for CE, RE 

and immunity to Surge .

All have passed those tests successfully 

Our clients is apprehensive whether the surge tests may have weakened the IC's such as VFC110 

and wants a positive confirmation from the Horse's mouth, so to speak.

The 0-10 V Input is first passed thru' a TIA before being applied to the VFC110, so any surge is first taken by the TIA.

and the Power Supplies have adequate protection in the design to enable them to pass those tests.

Would someone be able to confirm that the IC's have not been degraded or any reduction in their expected life 

The IC's are fully functional as such including the Internal Cos and Res.

Thanks and regards

Varun

  • 0
    TI__Genius 11945 points

    Hi Varun,

    We have no way of knowing if there has been any damage to these devices.  There can be incremental damage to transient conditions that may not be detectable by your system.  But, as long as there has been no violation of the absolute maximum conditions, there should be no reason to suspect any damage.

    Do you have any scope plots of the supply voltage and input pins on the IC for the surge tests?  This would be a good way to verify that no device is being subjected to conditions that exceed the absolute maximum voltage.

    Regards,
    Mike

  • +1 in reply to Michael Hartshorne
    Intellectual 860 points

    Hi Mike

    Thanks for your prompt reply.

    Unfortunately we do not have scope plots for the Input or PS Pins of the IC,

    as during the test we are not allowed to handle the EUT..

    Although the IC's do not seem to have suffered any damage, but with due prudence

    we may not ship them , but keep them for our internal tests and study.

    Thanks again for your prompt replies as always

    Varun